Inventor · disambiguated record
Seizo Morita
Also filed as: MORITA SEIZO
9 granted patents·278 citations·filing 1987–2008
89Inventor score
Top patents by PatentIndex Score
9 records- 0193US5289004AScanning probe microscope having cantilever and detecting sample characteristics by means of reflected sample examination lightOLYMPUS OPTICAL CO·Filed 1992·Granted Feb 22, 1994·154 cites·19 claims
- 0285US7703314B2Probe position control system and methodSHIMADZU CORP·Filed 2007·Granted Apr 27, 2010·14 cites·20 claims
- 0379US4877957AScanning type tunnel microscopeOLYMPUS OPTICAL CO·Filed 1987·Granted Oct 31, 1989·40 cites·19 claims
- 0471US8037739B2Method for analyzing sample in liquidSHIMADZU CORP·Filed 2008·Granted Oct 18, 2011·5 cites·17 claims
- 0565US6097197AScanning probe microscopeOLYMPUS OPTICAL CO·Filed 1997·Granted Aug 1, 2000·34 cites·13 claims
- 0653US7975316B2Atomic force microscope and interaction force measurement method using atomic force microscopeUNIV OSAKA·Filed 2008·Granted Jul 5, 2011·2 cites·7 claims
- 0752US5185572AScanning tunneling potentio-spectroscopic microscope and a data detecting methodOLYMPUS OPTICAL CO·Filed 1990·Granted Feb 9, 1993·13 cites·11 claims
- 0843US5378983AScanning tunneling potentio-spectroscopic microscope and a data detecting methodOLYMPUS OPTICAL CO·Filed 1992·Granted Jan 3, 1995·8 cites·12 claims
- 0941US5025153AScanning tunneling spectroscope and a spectroscopic information detection methodOLYMPUS OPTICAL CO·Filed 1990·Granted Jun 18, 1991·8 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →