Inventor · disambiguated record
Frank Fehrmann
Also filed as: FEHRMANN FRANK
8 granted patents·4 pending applications·21 citations·filing 2004–2024
79Inventor score
Top patents by PatentIndex Score
12 records- 0174US9110131B2Method and device for contacting a row of contact areas with probe tipsDIETRICH CLAUS·Filed 2010·Granted Aug 18, 2015·5 cites·19 claims
- 0263US11703541B2Semiconductor inspecting method for ensuring scrubbing length on padMPI CORP·Filed 2021·Granted Jul 18, 2023·0 cites·7 claims
- 0363US11693050B2Semiconductor inspecting methodMPI CORP·Filed 2021·Granted Jul 4, 2023·0 cites·5 claims
- 0462US7057408B2Method and prober for contacting a contact area with a contact tipSUSS MICROTEC TEST SYS GMBH·Filed 2004·Granted Jun 6, 2006·11 cites·13 claims
- 0558US2025191946A1Probe system, method for wafer test management system in a probe system, and non-transitory computer-readable medium thereofMPI CORP·Filed 2024·Application pending·0 cites
- 0651US8368413B2Method for testing electronic components of a repetitive pattern under defined thermal conditionsKANEV STOJAN·Filed 2009·Granted Feb 5, 2013·2 cites·12 claims
- 0750US7573283B2Method for measurement of a device under testSUSS MICRO TEC TEST SYSTEMS GM·Filed 2007·Granted Aug 11, 2009·3 cites·15 claims
- 0844US10996239B1Method of positioning probe tips relative to padsMPI CORP·Filed 2020·Granted May 4, 2021·0 cites·15 claims
- 0944US2021333219A1Method of determining distance between probe and wafer held by wafer probe stationMPI CORP·Filed 2020·Application pending·0 cites
- 1043US9373533B2Systems and methods for providing wafer access in a wafer processing systemCASCADE MICROTECH INC·Filed 2013·Granted Jun 21, 2016·0 cites·20 claims
- 1140US2008284457A1Method and apparatus for control of a positioning deviceSUSS MICROTEC TEST SYS GMBH·Filed 2008·Application pending·0 cites
- 1240US2010029022A1Method for improved utilization of semiconductor materialSUSS MICROTEC TEST SYS GMBH·Filed 2008·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →