Inventor · disambiguated record
Hiroki Miyai
Also filed as: MIYAI HIROKI
6 granted patents·4 pending applications·9 citations·filing 2013–2025
72Inventor score
Files withLASERTEC CORP10
Top patents by PatentIndex Score
10 records- 0184US10319088B2Inspection apparatus of EUV mask and its focus adjustment methodLASERTEC CORP·Filed 2017·Granted Jun 11, 2019·5 cites·14 claims
- 0271US9638739B2Defect coordinates measurement device, defect coordinates measurement method, mask manufacturing method, and reference maskLASERTEC CORP·Filed 2013·Granted May 2, 2017·2 cites·9 claims
- 0367US2025291262A1Optical apparatus and control method of optical apparatusLASERTEC CORP·Filed 2025·Application pending·0 cites
- 0464US10706527B2Correction method, correction apparatus, and inspection apparatusLASERTEC CORP·Filed 2018·Granted Jul 7, 2020·1 cites·5 claims
- 0560US9786057B2Inspection apparatus, coordinate detection apparatus, coordinate detection method, and wavefront aberration correction methodLASERTEC CORP·Filed 2015·Granted Oct 10, 2017·1 cites·12 claims
- 0658US2025117895A1Image processing apparatus, inspection apparatus, image processing method, and inspection methodLASERTEC CORP·Filed 2024·Application pending·0 cites
- 0757US11822233B2Image pickup apparatus and focus adjustment method using bending correction to adjust focusingLASERTEC CORP·Filed 2020·Granted Nov 21, 2023·0 cites·8 claims
- 0846US10156664B2Mask inspection apparatus and mask inspection methodLASERTEC CORP·Filed 2016·Granted Dec 18, 2018·0 cites·4 claims
- 0945US2021247323A1Inspection device and inspection methodLASERTEC CORP·Filed 2021·Application pending·0 cites
- 1041US2013234597A1Plasma shield device and plasma source apparatusLASERTEC CORP·Filed 2013·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →