Inventor · disambiguated record
Hyun-Ae Lee
Also filed as: LEE HYUN-AE
2 granted patents·2 pending applications·7 citations·filing 2007–2010
53Inventor score
Files withSAMSUNG ELECTRONICS CO LTD4
Top patents by PatentIndex Score
4 records- 0173US7990168B2Probe card including a sub-plate with a main supporter and a sub-supporter with the sub-supporter having probe needlesSAMSUNG ELECTRONICS CO LTD·Filed 2010·Granted Aug 2, 2011·3 cites·11 claims
- 0268US7888956B2Apparatus for testing a semiconductor device and a method of fabricating and using the sameSAMSUNG ELECTRONICS CO LTD·Filed 2008·Granted Feb 15, 2011·4 cites·19 claims
- 0350US2008180120A1Probe cardSAMSUNG ELECTRONICS CO LTD·Filed 2007·Application pending·0 cites
- 0434US2008164893A1Probe card for testing waferSAMSUNG ELECTRONICS CO LTD·Filed 2007·Application pending·0 cites
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →