Inventor · disambiguated record
Sei Yoshihara
Also filed as: YOSHIHARA Sei
7 granted patents·57 citations·filing 2014–2023
81Inventor score
Files withRIGAKU DENKI CO LTD7
Top patents by PatentIndex Score
7 records- 0198US11733185B2Fluorescent X-ray analysis apparatus comprising a plurality of X-ray detectors and an X-ray irradiation unit including a multi-wavelength mirrorRIGAKU DENKI CO LTD·Filed 2020·Granted Aug 22, 2023·12 cites·6 claims
- 0295US10473598B2X-ray thin film inspection deviceRIGAKU DENKI CO LTD·Filed 2014·Granted Nov 12, 2019·33 cites·19 claims
- 0388US11079345B2X-ray inspection deviceRIGAKU DENKI CO LTD·Filed 2018·Granted Aug 3, 2021·4 cites·8 claims
- 0486US10876978B2X-ray inspecting device, X-ray thin film inspecting method, and method for measuring rocking curveRIGAKU DENKI CO LTD·Filed 2017·Granted Dec 29, 2020·8 cites·10 claims
- 0583US12222303B2Transmissive small-angle scattering deviceRIGAKU DENKI CO LTD·Filed 2023·Granted Feb 11, 2025·0 cites·5 claims
- 0683US12019036B2Transmissive small-angle scattering deviceRIGAKU DENKI CO LTD·Filed 2023·Granted Jun 25, 2024·0 cites·3 claims
- 0768US11754515B2Transmissive small-angle scattering deviceRIGAKU DENKI CO LTD·Filed 2020·Granted Sep 12, 2023·0 cites·6 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →