Inventor · disambiguated record
Dong-Gyun Han
Also filed as: HAN DONG-GYUN
8 granted patents·3 pending applications·22 citations·filing 2003–2020
79Inventor score
Files withSAMSUNG ELECTRONICS CO LTD11
Top patents by PatentIndex Score
11 records- 0180US7560386B2Method of manufacturing nonvolatile semiconductor memory deviceSAMSUNG ELECTRONICS CO LTD·Filed 2007·Granted Jul 14, 2009·12 cites·24 claims
- 0263US11361960B2Substrate processing apparatus and substrate processing system including the sameSAMSUNG ELECTRONICS CO LTD·Filed 2020·Granted Jun 14, 2022·0 cites·20 claims
- 0361US7262141B2Methods for cleaning a semiconductor substrate having a recess channel regionSAMSUNG ELECTRONICS CO LTD·Filed 2005·Granted Aug 28, 2007·1 cites·19 claims
- 0460US7514741B2Nonvolatile semiconductor memory device and related methodSAMSUNG ELECTRONICS CO LTD·Filed 2006·Granted Apr 7, 2009·2 cites·5 claims
- 0559US7318870B2Method of cleaning semiconductor substrateSAMSUNG ELECTRONICS CO LTD·Filed 2003·Granted Jan 15, 2008·7 cites·5 claims
- 0654US10707071B2Substrate processing apparatus and substrate processing system including the sameSAMSUNG ELECTRONICS CO LTD·Filed 2017·Granted Jul 7, 2020·0 cites·19 claims
- 0745US7959738B2Method of removing photoresist and method of manufacturing a semiconductor deviceSAMSUNG ELECTRONICS CO LTD·Filed 2007·Granted Jun 14, 2011·0 cites·19 claims
- 0843US2015340250A1Wet etching nozzle, semiconductor manufacturing equipment including the same, and wet etching method using the sameSAMSUNG ELECTRONICS CO LTD·Filed 2014·Application pending·0 cites
- 0942US10668403B2Source supplier for a supercritical fluid, substrate processing apparatus having the sameSAMSUNG ELECTRONICS CO LTD·Filed 2017·Granted Jun 2, 2020·0 cites·17 claims
- 1042US2008044971A1Method for fabricating a semiconductor device having a capacitorSAMSUNG ELECTRONICS CO LTD·Filed 2007·Application pending·0 cites
- 1136US2003145875A1Apparatus and methods for cleaning semiconductor wafers using vaporized chemicalsSAMSUNG ELECTRONICS CO LTD·Filed 2003·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →