Inventor · disambiguated record
Seigo Igaki
Also filed as: IGAKI SEIGO
10 granted patents·2 pending applications·965 citations·filing 1980–2006
92Inventor score
Files withFUJITSU LTD12
Top patents by PatentIndex Score
12 records- 0195US4559452AApparatus for detecting edge of semitransparent plane substanceFUJITSU LTD·Filed 1983·Granted Dec 17, 1985·121 cites·10 claims
- 0293US5088817ABiological object detection apparatusFUJITSU LTD·Filed 1989·Granted Feb 18, 1992·175 cites·18 claims
- 0392US4728186AUneven-surface data detection apparatusFUJITSU LTD·Filed 1986·Granted Mar 1, 1988·142 cites·33 claims
- 0489US4924085AUneven-surface data detection apparatusFUJITSU LTD·Filed 1989·Granted May 8, 1990·140 cites·27 claims
- 0588US5109428AMinutia data extraction in fingerprint identificationFUJITSU LTD·Filed 1989·Granted Apr 28, 1992·205 cites·4 claims
- 0684US5077803ABiological detecting system and fingerprint collating system employing sameFUJITSU LTD·Filed 1989·Granted Dec 31, 1991·162 cites·30 claims
- 0768US7079340B2Apparatus and method of measuring write magnetic field of recording headFUJITSU LTD·Filed 2004·Granted Jul 18, 2006·7 cites·14 claims
- 0848US2007127148A1Apparatus and method for detecting contact between head and recording medium, and method for manufacturing headFUJITSU LTD·Filed 2006·Application pending·0 cites
- 0946US5859357AApparatus for measuring friction force between a magnetic head and a magnetic diskFUJITSU LTD·Filed 1996·Granted Jan 12, 1999·12 cites·12 claims
- 1046US2007127147A1Contact detecting apparatus, and method for detecting contactFUJITSU LTD·Filed 2006·Application pending·0 cites
- 1131US4484077AExposure system and method using an electron beamFUJITSU LTD·Filed 1980·Granted Nov 20, 1984·1 cites·15 claims
- 1228US5993982AMethod and apparatus for evaluating durability of magnetic diskFUJITSU LTD·Filed 1997·Granted Nov 30, 1999·0 cites·6 claims
Join the waitlist — get patent alerts
Get an alert when Seigo Igaki files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →