Inventor · disambiguated record
Lim Hooi Weng
Also filed as: WENG LIM HOOI
3 granted patents·1 citations·filing 2015–2018
47Inventor score
Top patents by PatentIndex Score
3 records- 0145US11085950B2Interface apparatus for semiconductor testingSPIRE MFG INC·Filed 2018·Granted Aug 10, 2021·0 cites·18 claims
- 0243US10096958B2Interface apparatus for semiconductor testing and method of manufacturing sameDAU HAI·Filed 2015·Granted Oct 9, 2018·1 cites·7 claims
- 0337US9933479B2Multi-die interface for semiconductor testing and method of manufacturing sameSPIRE MFG INC·Filed 2015·Granted Apr 3, 2018·0 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →