Inventor · disambiguated record
Bede Pittenger
Also filed as: PITTENGER BEDE
10 granted patents·4 pending applications·42 citations·filing 2009–2025
88Inventor score
Top patents by PatentIndex Score
14 records- 0196US11635449B2Nanoscale dynamic mechanical analysis via atomic force microscopy (AFM-nDMA)BRUKER NANO INC·Filed 2022·Granted Apr 25, 2023·6 cites·20 claims
- 0295US11307220B2Nanoscale dynamic mechanical analysis via atomic force microscopy (AFM-nDMA)BRUKER NANO INC·Filed 2021·Granted Apr 19, 2022·6 cites·22 claims
- 0395US11029330B2Nanoscale dynamic mechanical analysis via atomic force microscopy (AFM-nDMA)BRUKER NANO INC·Filed 2019·Granted Jun 8, 2021·8 cites·20 claims
- 0493US11940461B2Nanoscale dynamic mechanical analysis via atomic force microscopy (AFM-nDMA)BRUKER NANO INC·Filed 2023·Granted Mar 26, 2024·2 cites·20 claims
- 0591US9910064B2Force measurement with real-time baseline determinationBRUKER NANO INC·Filed 2017·Granted Mar 6, 2018·3 cites·11 claims
- 0686US9575090B2Force measurement with real-time baseline determinationBRUKER NANO INC·Filed 2014·Granted Feb 21, 2017·5 cites·9 claims
- 0786US8997259B2Method and apparatus of tuning a scanning probe microscopeBRUKER NANO INC·Filed 2012·Granted Mar 31, 2015·5 cites·20 claims
- 0882US12241911B2Nanoscale dynamic mechanical analysis via atomic force microscopy (AFM-nDMA)BRUKER NANO INC·Filed 2024·Granted Mar 4, 2025·0 cites·20 claims
- 0974US2025147066A1Nanoscale Dynamic Mechanical Analysis Via Atomic Force Microscopy (AFM-nDMA)BRUKER NANO INC·Filed 2025·Application pending·0 cites
- 1073US7979916B2Preamplifying cantilever and applications thereofPITTENGER BEDE·Filed 2009·Granted Jul 12, 2011·7 cites·44 claims
- 1164US2018299479A1Force Measurement with Real-Time Baseline DeterminationBRUKER NANO INC·Filed 2018·Application pending·0 cites
- 1260US2025277809A1Probe-Based Instrument and Method Using Torsional Oscillation SensingBRUKER NANO INC·Filed 2025·Application pending·0 cites
- 1359US9116167B2Method and apparatus of tuning a scanning probe microscopeBRUKER NANO INC·Filed 2015·Granted Aug 25, 2015·0 cites·11 claims
- 1456US2016109477A1Method and Apparatus of Tuning a Scanning Probe MicroscopeBRUKER NANO INC·Filed 2015·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →