Inventor · disambiguated record
Heikki Johannes Sipilä
Also filed as: SIPILA HEIKKI · SIPILA HEIKKI J · SIPILA HEIKKI JOHANNES · SIPILAE HEIKKI
36 granted patents·7 pending applications·433 citations·filing 1977–2021
97Inventor score
Files withOXFORD INSTR ANALYTICAL OY9OUTOKUMPU OY8FENNO AURUM OY4OUTOTEC FINLAND OY4SIPILÄ HEIKKI JOHANNES3
Top patents by PatentIndex Score
43 records- 0194US7020238B1Adapter and analyzer device for performing X-ray fluorescence analysis on hot surfacesOXFORD INSTR ANALYTICAL OY·Filed 2005·Granted Mar 28, 2006·49 cites·18 claims
- 0291US11680913B2X-ray fluorescence analyzer system and a method for performing X-ray fluorescence analysis of an element of interest in slurryOUTOTEC FINLAND OY·Filed 2019·Granted Jun 20, 2023·7 cites·18 claims
- 0391US11360036B2X-ray fluorescence analyzer, and a method for performing X-ray fluorescence analysisOUTOTEC FINLAND OY·Filed 2018·Granted Jun 14, 2022·8 cites·29 claims
- 0491US11199513B2X-ray fluorescence analyzer with a plurality of measurement channels, and a method for performing x-ray fluorescence analysisOUTOTEC FINLAND OY·Filed 2018·Granted Dec 14, 2021·8 cites·25 claims
- 0590US7233643B2Measurement apparatus and method for determining the material composition of a sample by combined X-ray fluorescence analysis and laser-induced breakdown spectroscopyOXFORD INSTR ANALYTICAL OY·Filed 2005·Granted Jun 19, 2007·43 cites·21 claims
- 0682US6242740B1Imaging system functioning on submillimeter wavesMETOREX INTERNAT OY·Filed 1998·Granted Jun 5, 2001·88 cites·17 claims
- 0782US4278885AApparatus for measuring the concentrations of elements in a material by the capture gamma methodOUTOKUMPU OY·Filed 1979·Granted Jul 14, 1981·45 cites·16 claims
- 0881US7065174B2Measurement arrangement for X-ray fluoresence analysisOXFORD INSTR ANALYTICAL OY·Filed 2004·Granted Jun 20, 2006·30 cites·23 claims
- 0979US6933503B2Imaging X-ray detector based on direct conversionOXFORD INSTR ANALYTICAL OY·Filed 2003·Granted Aug 23, 2005·28 cites·19 claims
- 1076US11815480B2X-ray fluorescence analyzer and a method for performing an x-ray fluorescence analysisOUTOTEC FINLAND OY·Filed 2018·Granted Nov 14, 2023·1 cites·22 claims
- 1176US9607723B2Ultra thin radiation window and method for its manufacturingSIPILÄ HEIKKI JOHANNES·Filed 2010·Granted Mar 28, 2017·3 cites·8 claims
- 1275US9182362B2Apparatus for protecting a radiation windowBRUKER AXS HANDHELD INC·Filed 2013·Granted Nov 10, 2015·3 cites·19 claims
- 1375US9070530B2X-ray tube and X-ray fluorescence analyser utilizing selective excitation radiationSIPILÄ HEIKKI JOHANNES·Filed 2012·Granted Jun 30, 2015·3 cites·21 claims
- 1474US7660393B2Gas tight radiation window, and a method for its manufacturingOXFORD INSTR ANALYTICAL OY·Filed 2007·Granted Feb 9, 2010·4 cites·17 claims
- 1573US7443959B2Selective irradiation of small target area in X-ray fluorescent spectroscopyOXFORD INSTR ANALYTICAL OY·Filed 2006·Granted Oct 28, 2008·9 cites·18 claims
- 1669US10483079B2Method for manufacturing radiation window and a radiation windowHS Folis Oy·Filed 2016·Granted Nov 19, 2019·1 cites·13 claims
- 1767US9564252B2Method and arrangement for manufacturing a radiation windowKOSTAMO ESA·Filed 2012·Granted Feb 7, 2017·3 cites·15 claims
- 1862US9640358B2Reinforced radiation window, and method for manufacturing the sameKOSTAMO ESA·Filed 2012·Granted May 2, 2017·2 cites·19 claims
- 1961US11686613B2Ultraviolet flame detectorFENNO AURUM OY·Filed 2021·Granted Jun 27, 2023·0 cites·13 claims
- 2052US9697922B2Radiation window with good strength properties, and method for its manufacturingSIPILÄ HEIKKI JOHANNES·Filed 2011·Granted Jul 4, 2017·0 cites·4 claims
- 2152US2016091613A1Semiconductor radiation detector with lowered background noise levelFENNO AURUM OY·Filed 2013·Application pending·0 cites
- 2251US6967329B2Radiation detector, arrangement and method for measuring radioactive radiation, where continuous low-energy background noise is reducedOXFORD INSTR ANALYTICAL OY·Filed 2002·Granted Nov 22, 2005·4 cites·12 claims
- 2350US2015060663A1Electron source and X-ray fluorescence analyser using an electron sourceSIPILA HEIKKI JOHANNES·Filed 2014·Application pending·0 cites
- 2449US11469086B2Method for manufacturing a multilayer radiation window and a multilayer radiation windowAMETEK FINLAND OY·Filed 2018·Granted Oct 11, 2022·0 cites·15 claims
- 2548US4795273APropeller shaft bearing arrangementWAERTSILAE OY AB·Filed 1987·Granted Jan 3, 1989·8 cites·4 claims
- 2647US5107527AMethod and apparatus for analyzing sludgy materialsOUTOKUMPU OY·Filed 1991·Granted Apr 21, 1992·16 cites·6 claims
- 2747US4653081AMethod for taking the radiation background into account in the determination of radiation intensities of analyzed samplesOUTOKUMPU OY·Filed 1984·Granted Mar 24, 1987·14 cites·5 claims
- 2846US7727796B2Method for patterning detector crystal using Q-switched laserOXFORD INSTR ANALYTICAL OY·Filed 2007·Granted Jun 1, 2010·0 cites·11 claims
- 2946US2020299833A1Radiation window structure and a method for manufacturing the radiation window structureHS FOILS OY·Filed 2016·Application pending·0 cites
- 3045US11105936B2Gas drift detectorHEIKKI SIPILA OY·Filed 2017·Granted Aug 31, 2021·0 cites·13 claims
- 3145US4733976APropeller shaft bearing arrangementWAERTSILAE OY AB·Filed 1987·Granted Mar 29, 1988·8 cites·15 claims
- 3244US2024234072A9A uv sensitive photocathode, a method for producing a uv sensitive photocathode, and a detector for measuring uv radiationFENNO AURUM OY·Filed 2021·Application pending·0 cites
- 3343US6049589AX-ray fluorescence measuring system making use of polarized excitation radiation, and X-ray tubeMETOREX INT OY·Filed 1998·Granted Apr 11, 2000·9 cites·7 claims
- 3442US4180735AMethod and device for measuring the particle size in a slurry or a flow of materialOUTOKUMPU OY·Filed 1977·Granted Dec 25, 1979·8 cites·2 claims
- 3541US4075486AMethod and device for diminishing the background effect in a proportional counterOUTOKUMPU OY·Filed 1977·Granted Feb 21, 1978·5 cites·6 claims
- 3640US7173250B2Drift-type detector with limited noise levelOXFORD INSTR ANALTYICAL OY·Filed 2004·Granted Feb 6, 2007·0 cites·19 claims
- 3738US5379602AMethod for providing cooling and a cooling apparatus suited for the sameOUTOKUMPU INSTR OY·Filed 1993·Granted Jan 10, 1995·10 cites·23 claims
- 3836US2007230664A1Collimator for x-ray spectrometry, and an x-ray spectrometric apparatusOXFORD INSTR ANALYTICAL OY·Filed 2006·Application pending·0 cites
- 3935US4703846AMethod and apparatus for arranging fragmentary particles into a row consisting of individual particlesOUTOKUMPU OY·Filed 1987·Granted Nov 3, 1987·9 cites·3 claims
- 4035US4520267AMethod and apparatus for analyzing ore by means of gamma radiationOUTOKUMPU OY·Filed 1981·Granted May 28, 1985·7 cites·10 claims
- 4132US2015355116A1Wavelength dispersive crystal spectrometer, a xray fluorescence device and a method thereinFENNO AURUM OY·Filed 2015·Application pending·0 cites
- 4231US2022399196A1A shield device for a radiation window, a radiation arrangement comprising the shield device, and a method for producing the shield deviceAMETEK FINLAND OY·Filed 2019·Application pending·0 cites
- 4326US4571196AWay to prolong the service life of proportional countersOUTOKUMPU OY·Filed 1984·Granted Feb 18, 1986·0 cites·5 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →