Inventor · disambiguated record
Hsiang-Chou Liao
Also filed as: LIAO HSIANG-CHOU
4 granted patents·2 pending applications·9 citations·filing 2010–2014
67Inventor score
Top patents by PatentIndex Score
6 records- 0182US9589086B2Method for measuring and analyzing surface structure of chip or waferMACRONIX INT CO LTD·Filed 2014·Granted Mar 7, 2017·5 cites·25 claims
- 0264US9244112B2Method for detecting an electrical defect of contact/via plugsMACRONIX INT CO LTD·Filed 2014·Granted Jan 26, 2016·1 cites·22 claims
- 0355US8594963B2In-line inspection yield prediction systemLIAO HSIANG-CHOU·Filed 2010·Granted Nov 26, 2013·1 cites·18 claims
- 0450US8329480B2Test pattern for detecting piping in a memory arrayHUNG CHE-LUN·Filed 2010·Granted Dec 11, 2012·2 cites·17 claims
- 0543US2015110384A1Image inspection method of die to databaseMACRONIX INT CO LTD·Filed 2014·Application pending·0 cites
- 0643US2016123905A1Inspection of inconsistencies in and on semiconductor devices and structuresMACRONIX INT CO LTD·Filed 2014·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →