Inventor · disambiguated record
Oh-Kyum Kwon
Also filed as: KWON OH-KYUM
8 granted patents·4 pending applications·32 citations·filing 2007–2017
83Inventor score
Top patents by PatentIndex Score
12 records- 0186US9524795B2One-time programmable (OTP) memory cell and OTP memory device for multi-bit programLEE JOON-HYUNG·Filed 2015·Granted Dec 20, 2016·11 cites·20 claims
- 0282US8018021B2Schottky diode and method of fabricating the sameSAMSUNG ELECTRONICS CO LTD·Filed 2010·Granted Sep 13, 2011·6 cites·1 claims
- 0375US8587045B2Nonvolatile memory device and method of forming the sameKWON OH-KYUM·Filed 2011·Granted Nov 19, 2013·5 cites·5 claims
- 0473US9991308B2Image sensorSAMSUNG ELECTRONICS CO LTD·Filed 2017·Granted Jun 5, 2018·2 cites·15 claims
- 0571US7705409B2High voltage transistorsSAMSUNG ELECTRONICS CO LTD·Filed 2008·Granted Apr 27, 2010·5 cites·15 claims
- 0665US8525273B2Integrated circuit devices including device isolation structures and methods of fabricating the sameKWON OH-KYUM·Filed 2011·Granted Sep 3, 2013·2 cites·16 claims
- 0760US8987797B2Nonvolatile memory device and method of forming the sameSAMSUNG ELECTRONICS CO LTD·Filed 2013·Granted Mar 24, 2015·1 cites·12 claims
- 0846US2008006899A1Schottky diode and method of fabricating the sameSAMSUNG ELECTRONICS CO LTD·Filed 2007·Application pending·0 cites
- 0945US2013313654A1Integrated Circuit Devices Including Device Isolation Structures and Methods of Fabricating the SameKWON OH-KYUM·Filed 2013·Application pending·0 cites
- 1042US9825033B2Semiconductor devices and methods of manufacturing the sameSAMSUNG ELECTRONICS CO LTD·Filed 2016·Granted Nov 21, 2017·0 cites·19 claims
- 1141US2008293205A1Method of forming metal silicide layer, and method of manufacturing semiconductor device using the sameKWON OH-KYUM·Filed 2008·Application pending·0 cites
- 1239US2014353820A1Semiconductor device and method for fabricating the sameSAMSUNG ELECTRONICS CO LTD·Filed 2014·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →