Inventor · disambiguated record
Ju-Wha Jin
Also filed as: JIN JU · JIN JU-WHA
6 granted patents·3 pending applications·49 citations·filing 2002–2008
77Inventor score
Top patents by PatentIndex Score
9 records- 0193US7508504B2Automatic wafer edge inspection and review systemACCRETECH USA INC·Filed 2007·Granted Mar 24, 2009·44 cites·25 claims
- 0257US7480220B2Method of tilt compensation in an optical recording deviceSAMSUNG ELECTRONICS CO LTD·Filed 2007·Granted Jan 20, 2009·0 cites·14 claims
- 0355US7272090B2Device and method for compensating for tiltSAMSUNG ELECTRONICS CO LTD·Filed 2006·Granted Sep 18, 2007·0 cites·3 claims
- 0455US7065020B2Apparatus and method for compensating for tiltSAMSUNG ELECTRONICS CO LTD·Filed 2003·Granted Jun 20, 2006·3 cites·27 claims
- 0549US7283437B2Device and method for compensating for tilt in an optical disk apparatusSAMSUNG ELECTRONICS CO LTD·Filed 2003·Granted Oct 16, 2007·1 cites·32 claims
- 0647US7317671B2Apparatus and method for compensating for tiltSAMSUNG ELECTRONICS CO LTD·Filed 2002·Granted Jan 8, 2008·1 cites·8 claims
- 0747US2009122304A1Apparatus and Method for Wafer Edge Exclusion MeasurementACCRETECH USA INC·Filed 2008·Application pending·0 cites
- 0847US2009116727A1Apparatus and Method for Wafer Edge Defects DetectionACCRETECH USA INC·Filed 2008·Application pending·0 cites
- 0937US2004017754A1Tilt adjusting method and apparatus using jitter feedbackSAMSUNG ELECTRONICS CO LTD·Filed 2003·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →