Inventor · disambiguated record
Mutsuhiko Yoshioka
Also filed as: YOSHIOKA MUTSUHIKO
7 granted patents·4 pending applications·62 citations·filing 2002–2008
84Inventor score
Top patents by PatentIndex Score
11 records- 0180US7671609B2Sheet-like probe, method of producing the probe, and application of the probeJSR CORP·Filed 2005·Granted Mar 2, 2010·7 cites·7 claims
- 0276US7737707B2Sheet-like probe, method of producing the probe, and application of the probeJSR CORP·Filed 2005·Granted Jun 15, 2010·5 cites·14 claims
- 0375US6890605B2Method of film formation, insulating film, and substrate for semiconductorJSR CORP·Filed 2002·Granted May 10, 2005·19 cites·16 claims
- 0473US7656176B2Probe member for wafer inspection, probe card for wafer inspection and wafer inspection equipmentJSR CORP·Filed 2005·Granted Feb 2, 2010·5 cites·7 claims
- 0569US7297360B2Insulation filmJSR CORP·Filed 2003·Granted Nov 20, 2007·14 cites·15 claims
- 0666US6645881B2Method of forming coating film, method of manufacturing semiconductor device and coating solutionTOSHIBA KK·Filed 2002·Granted Nov 11, 2003·10 cites·16 claims
- 0750US2007151951A1Stopper for chemical mechanical planarization, method for manufacturing same, and chemical mechanical planarization methodJSR CORP·Filed 2007·Application pending·0 cites
- 0849US7189651B2Stopper for chemical mechanical planarization, method for manufacturing same, and chemical mechanical planarization methodJSR CORP·Filed 2003·Granted Mar 13, 2007·2 cites·8 claims
- 0947US2006252044A1Biochip and biochip kit, and method of producing the same and method of using the sameJSR CORP·Filed 2004·Application pending·0 cites
- 1039US2007268032A1Probe Member for Wafer Inspection, Probe Card for Wafer Inspection and Wafer Inspection ApparatusJSR CORP·Filed 2005·Application pending·0 cites
- 1138US2009015281A1Method of positioning an anisotropic conductive connector, method of positioning the anisotropic conductive connector and a circuit board for inspection, anisotropic conductive connector, and probe cardJSR CORP·Filed 2008·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →