Inventor · disambiguated record
Yasufumi Fujiwara
Also filed as: FUJIWARA YASUFUMI
7 granted patents·3 pending applications·5 citations·filing 2003–2022
73Inventor score
Top patents by PatentIndex Score
10 records- 0165US9455376B2Substrate for nitride semiconductor device and production method thereof, and red light emitting semiconductor device and production method thereofUNIV OSAKA·Filed 2013·Granted Sep 27, 2016·2 cites·20 claims
- 0264US8409897B2Production method of red light emitting semiconductor deviceNISHIKAWA ATSUSHI·Filed 2010·Granted Apr 2, 2013·2 cites·4 claims
- 0361US11133435B2Nitride semiconductor substrate, manufacturing method therefor, and semiconductor deviceUNIV OSAKA·Filed 2017·Granted Sep 28, 2021·1 cites·20 claims
- 0456US12364058B2Near-infrared light emitting semiconductor element and method for manufacturing sameUNIV OSAKA·Filed 2022·Granted Jul 15, 2025·0 cites·12 claims
- 0554US12068432B2Display device and method of manufacturing sameUNIV OSAKA·Filed 2021·Granted Aug 20, 2024·0 cites·20 claims
- 0654US2024339568A1Rare-earth-doped semiconductor device and method for producing the sameUNIV OSAKA·Filed 2022·Application pending·0 cites
- 0750US12074254B2Nitride semiconductor device and substrate thereof, method for forming rare earth element-added nitride layer, and red-light emitting device and method for manufacturing the sameUNIV OSAKA·Filed 2019·Granted Aug 27, 2024·0 cites·22 claims
- 0845US11075322B2AlInN film, two-dimensional photonic crystal resonator, method for manufacturing these, and semiconductor light-emitting elementUNIV OSAKA·Filed 2018·Granted Jul 27, 2021·0 cites·13 claims
- 0936US2021091268A1Color tunable light emission diode and micro led displayUNIV LEHIGH·Filed 2020·Application pending·0 cites
- 1030US2006071218A1Semiconductior multilayer structurehaving inhomogeneous quantum dots, light-emitting diode using same, semiconductor laser diode, semiconductor optical amplifier, and method for manufacturing themJAPAN SCIENCE & TECH AGENCY·Filed 2003·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →