Inventor · disambiguated record
Yoshihiro Nabe
Also filed as: NABE YOSHIHIRO
13 granted patents·1 pending application·210 citations·filing 2000–2022
91Inventor score
Top patents by PatentIndex Score
14 records- 0192US6483714B1Multilayered wiring boardKYOCERA CORP·Filed 2000·Granted Nov 19, 2002·157 cites·6 claims
- 0291US7851880B2Solid-state imaging deviceSONY CORP·Filed 2007·Granted Dec 14, 2010·25 cites·7 claims
- 0390US9379155B2Semiconductor device and method of manufacturing the sameSONY CORP·Filed 2015·Granted Jun 28, 2016·5 cites·16 claims
- 0486US10050074B2Semiconductor device and method of manufacturing the sameSONY CORP·Filed 2016·Granted Aug 14, 2018·3 cites·20 claims
- 0583US11315970B2Semiconductor device and method of manufacturing the sameSONY CORP·Filed 2018·Granted Apr 26, 2022·2 cites·18 claims
- 0681US9041179B2Semiconductor device and method of manufacturing the sameSONY CORP·Filed 2014·Granted May 26, 2015·3 cites·5 claims
- 0779US8252628B2Semiconductor device and method of manufacturing the sameNABE YOSHIHIRO·Filed 2008·Granted Aug 28, 2012·6 cites·6 claims
- 0878US11676977B2Semiconductor deviceSONY GROUP CORP·Filed 2022·Granted Jun 13, 2023·0 cites·20 claims
- 0973US8455969B2Semiconductor device and method for manufacturing the sameNABE YOSHIHIRO·Filed 2008·Granted Jun 4, 2013·7 cites·22 claims
- 1059US8564101B2Semiconductor apparatus having a through-hole interconnectionHARADA YOSHIMICHI·Filed 2009·Granted Oct 22, 2013·2 cites·2 claims
- 1152US2012286387A1Semiconductor device and method of manufacturing the sameNABE YOSHIHIRO·Filed 2012·Application pending·0 cites
- 1251US11693204B2Imaging device and method of manufacturing imaging deviceSONY SEMICONDUCTOR SOLUTIONS CORP·Filed 2018·Granted Jul 4, 2023·0 cites·7 claims
- 1349US7939360B2Semiconductor device and manufacturing method thereforSONY CORP·Filed 2009·Granted May 10, 2011·0 cites·7 claims
- 1442US8273657B2Method for manufacturing a semiconductor apparatus having a through-hole interconnectionHARADA YOSHIMICHI·Filed 2011·Granted Sep 25, 2012·0 cites·4 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →