Inventor · disambiguated record
Takahiko Fukiage
Also filed as: FUKIAGE TAKAHIKO
11 granted patents·2 pending applications·247 citations·filing 1990–2021
90Inventor score
Files withMITSUBISHI ELECTRIC CORP6FUKIAGE TAKAHIKO2MICRON TECHNOLOGY INC2RENESAS TECH CORP2SHIMIZU ATSUSHI1
Top patents by PatentIndex Score
13 records- 0189US5905690ASynchronous semiconductor device having circuitry capable of surely resetting test modeMITSUBISHI ELECTRIC CORP·Filed 1998·Granted May 18, 1999·83 cites·15 claims
- 0283US5764584AMulti-bank synchronous semiconductor memory deviceMITSUBISHI ELECTRIC CORP·Filed 1997·Granted Jun 9, 1998·57 cites·17 claims
- 0381US8325537B2Mode register output circuitSHIMIZU ATSUSHI·Filed 2010·Granted Dec 4, 2012·8 cites·10 claims
- 0480US5400292ASemiconductor memory device with changeable input/output data bit arrangementMITSUBISHI ELECTRIC CORP·Filed 1993·Granted Mar 21, 1995·46 cites·26 claims
- 0574US6798679B2Semiconductor memory moduleRENESAS TECH CORP·Filed 2002·Granted Sep 28, 2004·18 cites·7 claims
- 0672US8094512B2Semiconductor memory device with individual and selective refresh of data storage banksFUKIAGE TAKAHIKO·Filed 2010·Granted Jan 10, 2012·6 cites·20 claims
- 0771US5008609AVoltage generating circuit for semiconductor deviceMITSUBISHI ELECTRIC CORP·Filed 1990·Granted Apr 16, 1991·25 cites·3 claims
- 0863US11335393B2Semiconductor device performing refresh operation in deep sleep modeMICRON TECHNOLOGY INC·Filed 2021·Granted May 17, 2022·0 cites·20 claims
- 0963US10923171B2Semiconductor device performing refresh operation in deep sleep modeMICRON TECHNOLOGY INC·Filed 2018·Granted Feb 16, 2021·1 cites·18 claims
- 1041US2005030815A1Semiconductor memory moduleMITSUBISHI ELECTRIC CORP·Filed 2004·Application pending·0 cites
- 1140US6801460B2Semiconductor memory device suppressing peak currentRENESAS TECH CORP·Filed 2003·Granted Oct 5, 2004·3 cites·4 claims
- 1235US8259526B2Semiconductor device performing serial parallel conversionFUKIAGE TAKAHIKO·Filed 2009·Granted Sep 4, 2012·0 cites·25 claims
- 1331US2003115528A1Semiconductor memory device capable of failure analysis with system in operationMITSUBISHI ELECTRIC CORP·Filed 2002·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →