Inventor · disambiguated record
Nian Yang
Also filed as: YANG NIAN · YANG NIAN-YUAN
83 granted patents·9 pending applications·1,063 citations·filing 2001–2020
99Inventor score
Files withADVANCED MICRO DEVICES INC43SPANSION LLC27HON HAI PREC IND CO LTD4CHEN YUN-LUNG3ANG BOON-AIK2
Top patents by PatentIndex Score
92 records- 0196US7042766B1Method of programming a flash memory device using multilevel charge storageSPANSION LLC·Filed 2004·Granted May 9, 2006·128 cites·9 claims
- 0294US6570787B1Programming with floating source for low power, low leakage and high density flash memory devicesADVANCED MICRO DEVICES INC·Filed 2002·Granted May 27, 2003·85 cites·33 claims
- 0393US7845608B1Mounting apparatus for electronic deviceHONGFUJIN PREC IND SHENZHEN·Filed 2009·Granted Dec 7, 2010·32 cites·15 claims
- 0493US6461905B1Dummy gate process to reduce the Vss resistance of flash productsADVANCED MICRO DEVICES INC·Filed 2002·Granted Oct 8, 2002·80 cites·25 claims
- 0592US7345916B2Method and apparatus for high voltage operation for a high performance semiconductor memory deviceSPANSION LLC·Filed 2006·Granted Mar 18, 2008·29 cites·12 claims
- 0691US7724075B2Method to provide a higher reference voltage at a lower power supply in flash memory devicesSPANSION LLC·Filed 2006·Granted May 25, 2010·27 cites·28 claims
- 0790US6660588B1High density floating gate flash memory and fabrication processes thereforADVANCED MICRO DEVICES INC·Filed 2002·Granted Dec 9, 2003·50 cites·49 claims
- 0890US6643185B1Method for repairing over-erasure of fast bits on floating gate memory devicesADVANCED MICRO DEVICES INC·Filed 2002·Granted Nov 4, 2003·55 cites·20 claims
- 0987US10567407B2Method and system for detecting malicious web addressesIYUNTIAN CO LTD·Filed 2015·Granted Feb 18, 2020·18 cites·18 claims
- 1087US7957204B1Flash memory programming power reductionSPANSION LLC·Filed 2005·Granted Jun 7, 2011·18 cites·19 claims
- 1187US6606273B1Methods and systems for flash memory tunnel oxide reliability testingADVANCED MICRO DEVICES INC·Filed 2002·Granted Aug 12, 2003·46 cites·21 claims
- 1286US6987696B1Method of improving erase voltage distribution for a flash memory array having dummy wordlinesSPANSION LLC·Filed 2004·Granted Jan 17, 2006·38 cites·12 claims
- 1385US6828623B1Floating gate memory device with homogeneous oxynitride tunneling dielectricADVANCED MICRO DEVICES INC·Filed 2002·Granted Dec 7, 2004·36 cites·27 claims
- 1484US7352626B1Voltage regulator with less overshoot and faster settling timeSPANSION LLC·Filed 2005·Granted Apr 1, 2008·16 cites·14 claims
- 1582US7505298B2Transfer of non-associated information on flash memory devicesSPANSION LLC·Filed 2007·Granted Mar 17, 2009·13 cites·20 claims
- 1679US6825526B1Structure for increasing drive current in a memory array and related methodADVANCED MICRO DEVICES INC·Filed 2004·Granted Nov 30, 2004·20 cites·20 claims
- 1777US6812514B1High density floating gate flash memory and fabrication processes thereforADVANCED MICRO DEVICES INC·Filed 2003·Granted Nov 2, 2004·19 cites·20 claims
- 1875US8456810B2Power supply assemblyCHEN YUN-LUNG·Filed 2010·Granted Jun 4, 2013·4 cites·19 claims
- 1972US7532518B2Compensation method to achieve uniform programming speed of flash memory devicesSPANSION LLC·Filed 2007·Granted May 12, 2009·8 cites·20 claims
- 2072US6991987B1Method for producing a low defect homogeneous oxynitrideADVANCED MICRO DEVICES INC·Filed 2002·Granted Jan 31, 2006·15 cites·17 claims
- 2172US6825684B1Hot carrier oxide qualification methodADVANCED MICRO DEVICES INC·Filed 2002·Granted Nov 30, 2004·14 cites·9 claims
- 2272US6797650B1Flash memory devices with oxynitride dielectric as the charge storage mediaADVANCED MICRO DEVICES INC·Filed 2003·Granted Sep 28, 2004·14 cites·22 claims
- 2370US7626882B2Flash memory device with external high voltage supplySPANSION LLC·Filed 2006·Granted Dec 1, 2009·7 cites·20 claims
- 2470US6646462B1Extraction of drain junction overlap with the gate and the channel length for ultra-small CMOS devices with ultra-thin gate oxidesADVANCED MICRO DEVICES INC·Filed 2002·Granted Nov 11, 2003·13 cites·30 claims
- 2570US6486682B1Determination of dielectric constants of thin dielectric materials in a MOS (metal oxide semiconductor) stackADVANCED MICRO DEVICES INC·Filed 2001·Granted Nov 26, 2002·14 cites·24 claims
- 2669US7433228B2Multi-bit flash memory device having improved program rateSPANSION LLC·Filed 2005·Granted Oct 7, 2008·7 cites·22 claims
- 2769US6784061B1Process to improve the Vss line formation for high density flash memory and related structure associated therewithADVANCED MICRO DEVICES INC·Filed 2002·Granted Aug 31, 2004·14 cites·25 claims
- 2868US8730685B2Mounting apparatus assemblyCHEN YUN-LUNG·Filed 2011·Granted May 20, 2014·2 cites·16 claims
- 2968US6642106B1Method for increasing core gain in flash memory device using strained siliconADVANCED MICRO DEVICES INC·Filed 2002·Granted Nov 4, 2003·11 cites·7 claims
- 3068US6472236B1Determination of effective oxide thickness of a plurality of dielectric materials in a MOS stackADVANCED MICRO DEVICES INC·Filed 2001·Granted Oct 29, 2002·12 cites·12 claims
- 3166US7948035B2Decoding system capable of charging protection for flash memory devicesSPANSION LLC·Filed 2008·Granted May 24, 2011·3 cites·10 claims
- 3266US6717850B1Efficient method to detect process induced defects in the gate stack of flash memory devicesADVANCED MICRO DEVICES INC·Filed 2002·Granted Apr 6, 2004·14 cites·22 claims
- 3366US6696331B1Method of protecting a stacked gate structure during fabricationADVANCED MICRO DEVICES INC·Filed 2002·Granted Feb 24, 2004·12 cites·38 claims
- 3466US6593590B1Test structure apparatus for measuring standby current in flash memory devicesADVANCED MICRO DEVICES INC·Filed 2002·Granted Jul 15, 2003·10 cites·20 claims
- 3565US8462564B1Flash memory programming power reductionWU YONGGANG·Filed 2011·Granted Jun 11, 2013·3 cites·20 claims
- 3665US7613042B2Decoding system capable of reducing sector select area overhead for flash memorySPANSION LLC·Filed 2007·Granted Nov 3, 2009·3 cites·19 claims
- 3765US6734028B1Method of detecting shallow trench isolation corner thinning by electrical stressADVANCED MICRO DEVICES INC·Filed 2002·Granted May 11, 2004·9 cites·16 claims
- 3864US7632749B1Semiconductor device having a pad metal layer and a lower metal layer that are electrically coupled, whereas apertures are formed in the lower metal layer below a center area of the pad metal layerSPANSION LLC·Filed 2004·Granted Dec 15, 2009·11 cites·5 claims
- 3963US6777957B1Test structure to measure interlayer dielectric effects and breakdown and detect metal defects in flash memoriesADVANCED MICRO DEVICES INC·Filed 2002·Granted Aug 17, 2004·8 cites·17 claims
- 4063US6756806B1Method of determining location of gate oxide breakdown of MOSFET by measuring currentsADVANCED MICRO DEVICES INC·Filed 2002·Granted Jun 29, 2004·10 cites·33 claims
- 4162USD624913SThin clientHON HAI PREC IND CO LTD·Filed 2009·Granted Oct 5, 2010·11 cites·1 claims
- 4262US6764920B1Method for reducing shallow trench isolation edge thinning on tunnel oxides using partial nitride strip and small bird's beak formation for high performance flash memory devicesADVANCED MICRO DEVICES INC·Filed 2002·Granted Jul 20, 2004·10 cites·22 claims
- 4361US6859748B1Test structure for measuring effect of trench isolation on oxide in a memory deviceADVANCED MICRO DEVICES INC·Filed 2002·Granted Feb 22, 2005·7 cites·24 claims
- 4461US6590260B1Memory device having improved programmabilityADVANCED MICRO DEVICES INC·Filed 2002·Granted Jul 8, 2003·9 cites·7 claims
- 4560US6596586B1Method of forming low resistance common source line for flash memory devicesADVANCED MICRO DEVICES INC·Filed 2002·Granted Jul 22, 2003·8 cites·14 claims
- 4659US7042767B2Flash memory unit and method of programming a flash memory deviceSPANSION LLC·Filed 2004·Granted May 9, 2006·10 cites·9 claims
- 4759US6734080B1Semiconductor isolation material deposition system and methodADVANCED MICRO DEVICES INC·Filed 2002·Granted May 11, 2004·8 cites·20 claims
- 4859US6731130B1Method of determining gate oxide thickness of an operational MOSFETADVANCED MICRO DEVICES INC·Filed 2001·Granted May 4, 2004·6 cites·9 claims
- 4958US10367849B2Method and system for detecting phishing pageBaidu online network technology beijing co ltd·Filed 2015·Granted Jul 30, 2019·1 cites·17 claims
- 5058US7019366B1Electrostatic discharge performance of a silicon structure and efficient use of area with electrostatic discharge protective device under the pad approach and adjustment of via configuration thereto to control drain junction resistanceFASL LLC·Filed 2004·Granted Mar 28, 2006·8 cites·13 claims
Showing the top 50 of 92 patent records by PatentIndex Score.
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →