Inventor · disambiguated record
Hyoun Soo Park
Also filed as: PARK HYOUN · PARK HYOUN-SOO
9 granted patents·28 citations·filing 2000–2024
84Inventor score
Top patents by PatentIndex Score
9 records- 0179US8928394B2Semiconductor integrated circuit and an operating method thereof, a timing verifying method for a semiconductor integrated circuit and a test method of a semiconductor integrated circuitSAMSUNG ELECTRONICS CO LTD·Filed 2013·Granted Jan 6, 2015·6 cites·19 claims
- 0277US10430546B2Integrated circuit, and computing system and computer-implemented method for designing integrated circuitSAMSUNG ELECTRONICS CO LTD·Filed 2017·Granted Oct 1, 2019·2 cites·20 claims
- 0365US10621300B2Computing system for performing colorless routing for quadruple patterning lithographySAMSUNG ELECTRONICS CO LTD·Filed 2017·Granted Apr 14, 2020·1 cites·20 claims
- 0465US6416648B1Method of manufacturing steel sheets coated with Zn-Fe alloyHYUNDAI MOTOR CO LTD·Filed 2000·Granted Jul 9, 2002·5 cites·2 claims
- 0564US9524922B2Integrated circuit having main route and detour route for signal transmission and integrated circuit package including the sameSAMSUNG ELECTRONICS CO LTD·Filed 2015·Granted Dec 20, 2016·2 cites·20 claims
- 0664US6624434B1Apparatus for measurement of particle or droplet velocitySARNOFF CORP·Filed 2000·Granted Sep 23, 2003·8 cites·13 claims
- 0762US12489431B2Test apparatus and test method for detecting defects of elements included in integrated circuitSAMSUNG ELECTRONICS CO LTD·Filed 2024·Granted Dec 2, 2025·0 cites·20 claims
- 0854US7961028B2Single supply pass gate level converter for multiple supply voltage systemPOSTECH ACAD IND FOUND·Filed 2009·Granted Jun 14, 2011·3 cites·6 claims
- 0953US8046724B2Method of timing criticality calculation for statistical timing optimization of VLSI circuitPOSTECH ACAD IND FOUND·Filed 2009·Granted Oct 25, 2011·1 cites·9 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →