Inventor · disambiguated record
Mervyn Y. Tan
Also filed as: TAN MERVYN · TAN MERVYN Y · TAN MERVYN YEE-MIN
16 granted patents·185 citations·filing 2004–2019
92Inventor score
Top patents by PatentIndex Score
16 records- 0197US7503020B2IC layout optimization to improve yieldIBM·Filed 2006·Granted Mar 10, 2009·110 cites·15 claims
- 0286US10303719B1Organization and retrieval of conditioned dataGOOGLE INC·Filed 2015·Granted May 28, 2019·5 cites·20 claims
- 0380US9888347B1Resolving location criteria using user location dataGOOGLE INC·Filed 2014·Granted Feb 6, 2018·5 cites·21 claims
- 0475US7240306B2Integrated circuit layout critical area determination using Voronoi diagrams and shape biasingIBM·Filed 2005·Granted Jul 3, 2007·8 cites·20 claims
- 0574US11354358B1Organization and retrieval of conditioned dataGOOGLE LLC·Filed 2019·Granted Jun 7, 2022·1 cites·20 claims
- 0674US7143371B2Critical area computation of composite fault mechanisms using voronoi diagramsIBM·Filed 2004·Granted Nov 28, 2006·16 cites·9 claims
- 0773US7302653B2Probability of fault function determination using critical defect size mapIBM·Filed 2005·Granted Nov 27, 2007·6 cites·18 claims
- 0871US7404159B2Critical area computation of composite fault mechanisms using Voronoi diagramsIBM·Filed 2006·Granted Jul 22, 2008·4 cites·13 claims
- 0970US7260790B2Integrated circuit yield enhancement using Voronoi diagramsIBM·Filed 2004·Granted Aug 21, 2007·15 cites·33 claims
- 1067US7661080B2Method and apparatus for net-aware critical area extractionIBM·Filed 2007·Granted Feb 9, 2010·4 cites·30 claims
- 1167US7310788B2Sample probability of fault function determination using critical defect size mapIBM·Filed 2005·Granted Dec 18, 2007·4 cites·25 claims
- 1264US7818694B2IC layout optimization to improve yieldIBM·Filed 2008·Granted Oct 19, 2010·2 cites·20 claims
- 1363US7634745B2Method for computing the critical area of compound fault mechanismsIBM·Filed 2006·Granted Dec 15, 2009·3 cites·16 claims
- 1461US7685553B2System and method for global circuit routing incorporating estimation of critical area estimate metricsIBM·Filed 2007·Granted Mar 23, 2010·2 cites·34 claims
- 1554US7810060B2Critical area computation of composite fault mechanisms using Voronoi diagramsIBM·Filed 2008·Granted Oct 5, 2010·0 cites·7 claims
- 1648US7752589B2Method, apparatus, and computer program product for displaying and modifying the critical area of an integrated circuit designIBM·Filed 2007·Granted Jul 6, 2010·0 cites·32 claims
Join the waitlist — get patent alerts
Get an alert when Mervyn Y. Tan files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →