Inventor · disambiguated record
Yaolei Zheng
Also filed as: ZHENG YAOLEI
2 granted patents·2 citations·filing 2012–2020
37Inventor score
Top patents by PatentIndex Score
2 records- 0176US11043239B2Magneto-optic Kerr effect metrology systemsKLA CORP·Filed 2020·Granted Jun 22, 2021·1 cites·10 claims
- 0246US8804106B2System and method for nondestructively measuring concentration and thickness of doped semiconductor layersZHU NANCHANG·Filed 2012·Granted Aug 12, 2014·1 cites·23 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →