Inventor · disambiguated record
Takao Yashiro
Also filed as: YASHIRO TAKAO
5 granted patents·7 pending applications·179 citations·filing 2001–2004
84Inventor score
Top patents by PatentIndex Score
12 records- 0193US6521677B2Radiation-curable metal particles and curable resin compositions comprising these particlesDSM NV·Filed 2001·Granted Feb 18, 2003·96 cites·15 claims
- 0284US6686047B2Reactive particles, curable composition comprising the same and cured productsDSM NV·Filed 2002·Granted Feb 3, 2004·20 cites·20 claims
- 0383US7122253B2Curable resin composition, cured film, and composite productDSM NV·Filed 2001·Granted Oct 17, 2006·28 cites·22 claims
- 0480US6818678B2Resin composition comprising particlesDSM IP ASSETS BV·Filed 2002·Granted Nov 16, 2004·18 cites·13 claims
- 0579US6846572B2Curable composition, cured product, and laminateDSM IP ASSETS BV·Filed 2002·Granted Jan 25, 2005·17 cites·16 claims
- 0640US2001046644A1Process for manufacturing information recording media and the information recording mediaFiled 2001·Application pending·0 cites
- 0739US2003040551A1Resin composition comprising inorganic particles and polymerizable phosphates and the products prepared therefromFiled 2002·Application pending·0 cites
- 0837US2003092790A1Photo-curable composition and the cured productsFiled 2002·Application pending·0 cites
- 0937US2003105189A1Radiation-curable metal particles and curable resin compositions comprising these particlesDSM N V JSR CORP·Filed 2002·Application pending·0 cites
- 1036US2007004816A1Photocurable resin compositionYASHIRO TAKAO·Filed 2004·Application pending·0 cites
- 1135US2007069744A1Board for probe card, inspection apparatus, photo-fabrication apparatus and photo-fabrication methodKOYAGI YASUYUKI·Filed 2004·Application pending·0 cites
- 1233US2007096355A1Photocurable resin compositionYASHIRO TAKAO·Filed 2004·Application pending·0 cites
Join the waitlist — get patent alerts
Get an alert when Takao Yashiro files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →