Inventor · disambiguated record
Kazuyoshi Fukuda
Also filed as: FUKUDA KAZUYOSHI
8 granted patents·1 pending application·105 citations·filing 1998–2014
87Inventor score
Top patents by PatentIndex Score
9 records- 0175USD480371SSemiconductor deviceTOSHIBA KK·Filed 2002·Granted Oct 7, 2003·23 cites·1 claims
- 0273US9323595B2Microcontroller, control device and determination methodYAMADA HIROMICHI·Filed 2012·Granted Apr 26, 2016·4 cites·18 claims
- 0372US6127729ASemiconductor chip with corner electrode terminals and detecting wiring for defect inspectionMITSUBISHI ELECTRIC CORP·Filed 1998·Granted Oct 3, 2000·38 cites·3 claims
- 0466USD473199SPortion of semiconductor deviceTOSHIBA KK·Filed 2002·Granted Apr 15, 2003·16 cites·1 claims
- 0560US6448783B1Method of inspecting semiconductor chip with projecting electrodes for defectsMITSUBISHI ELECTRIC CORP·Filed 2000·Granted Sep 10, 2002·7 cites·3 claims
- 0659US9229830B2Semiconductor integrated circuit device and microcontrollerRENESAS ELECTRONICS CORP·Filed 2013·Granted Jan 5, 2016·1 cites·18 claims
- 0745US6362523B1Semiconductor deviceMITSUBISHI ELECTRIC CORP·Filed 1999·Granted Mar 26, 2002·13 cites·4 claims
- 0845US2015046759A1Semiconductor integrated circuit deviceRENESAS ELECTRONICS CORP·Filed 2014·Application pending·0 cites
- 0931US6184569B1Semiconductor chip inspection structuresMITSUBISHI ELECTRIC CORP·Filed 1998·Granted Feb 6, 2001·3 cites·4 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →