Inventor · disambiguated record
Reiner Rygiel
Also filed as: RYGIEL REINER
7 granted patents·1 pending application·26 citations·filing 2000–2011
80Inventor score
Top patents by PatentIndex Score
8 records- 0160US6611338B1Method and apparatus for the interferometric examination of scattering objectsISIS OPTRONICS GMBH·Filed 2000·Granted Aug 26, 2003·15 cites·17 claims
- 0250US8922776B2Confocal laser scanning microscope and a method for investigating a sampleRYGIEL REINER·Filed 2011·Granted Dec 30, 2014·1 cites·9 claims
- 0350US7924027B2Arrangement for determining the distance, capacitive distance sensor and method for automatically focussing a microscopeLEICA MICROSYTEMS CMS GMBH·Filed 2007·Granted Apr 12, 2011·2 cites·6 claims
- 0449US7583436B2Sampler carrier for a confocal microscope and method for fabricating a sample carrierLEICA MICROSYSTEMS·Filed 2003·Granted Sep 1, 2009·3 cites·13 claims
- 0547US7477448B2Device and method for adjusting two objective lenses in 4Pi-systemLEICA MICROSYSTEMS·Filed 2004·Granted Jan 13, 2009·2 cites·31 claims
- 0644US7453578B24Pi microscopeLEICA MICROSYSTEMS·Filed 2004·Granted Nov 18, 2008·2 cites·15 claims
- 0744US7177058B2Beam deflection deviceLEICA MICROSYSTEMS·Filed 2004·Granted Feb 13, 2007·1 cites·17 claims
- 0838US2008130104A1Fine Tuning DeviceLEICA MICROSYSTEMS·Filed 2004·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →