Inventor · disambiguated record
Woo Young Lim
Also filed as: LIM WOO YOUNG
14 granted patents·2 pending applications·250 citations·filing 1999–2023
91Inventor score
Top patents by PatentIndex Score
16 records- 0194US7464807B2Transfer device of handler for testing semiconductor deviceMIRAE CORP·Filed 2005·Granted Dec 16, 2008·34 cites·11 claims
- 0293US7408338B2Handler for testing semiconductor devicesMIRAE CORP·Filed 2007·Granted Aug 5, 2008·25 cites·14 claims
- 0393US7196508B2Handler for testing semiconductor devicesMIRAE CORP·Filed 2005·Granted Mar 27, 2007·27 cites·30 claims
- 0490US6861861B2Device for compensating for a test temperature deviation in a semiconductor device handlerMIRAE CORPORATION·Filed 2003·Granted Mar 1, 2005·103 cites·28 claims
- 0571US6340073B1Elevator door systemLG IND SYSTEMS CO LTD·Filed 1999·Granted Jan 22, 2002·31 cites·5 claims
- 0663US7135703B2Test tray with carrier modules for a semiconductor device handlerMIRAE CORP·Filed 2003·Granted Nov 14, 2006·9 cites·23 claims
- 0761US11481893B2Apparatus for inspecting components mounted on printed circuit board, operating method thereof, and computer-readable recording mediumKOH YOUNG TECH INC·Filed 2021·Granted Oct 25, 2022·0 cites·4 claims
- 0860US7562923B2Tray transferring apparatus with gripper mechanismMIRAE CORP·Filed 2004·Granted Jul 21, 2009·18 cites·23 claims
- 0959US7429868B2Socket assembly for testing semiconductor deviceMIRAE CORP·Filed 2005·Granted Sep 30, 2008·1 cites·19 claims
- 1053US10997714B2Apparatus for inspecting components mounted on printed circuit board, operating method thereof, and computer-readable recording mediumKOH YOUNG TECH INC·Filed 2018·Granted May 4, 2021·0 cites·17 claims
- 1151US7609761B2Apparatus and method for abstracting motion picture shape descriptor including statistical characteristic of still picture shape descriptor, and video indexing system and method using the sameKT CORP·Filed 2002·Granted Oct 27, 2009·2 cites·14 claims
- 1249US2024223191A1Negative level shifter and display device including the sameMAGNACHIP SEMICONDUCTOR LTD·Filed 2023·Application pending·0 cites
- 1344US11360159B2Method for inspecting insertion states of pins inserted into substrate, and substrate inspection apparatusKOH YOUNG TECH INC·Filed 2018·Granted Jun 14, 2022·0 cites·20 claims
- 1443US11547033B2Method for inspecting insertion states of plurality of pins included in connector inserted into substrate, and substrate inspection apparatusKOH YOUNG TECH INC·Filed 2018·Granted Jan 3, 2023·0 cites·14 claims
- 1538US2010275687A1Housing for a measuring equipment and measuring equipment having the sameKOH YOUNG TECH INC·Filed 2010·Application pending·0 cites
- 1635US10827661B2Inspection apparatus and method, and system and method for mounting components including the sameKOH YOUNG TECH INC·Filed 2015·Granted Nov 3, 2020·0 cites·2 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →