Inventor · disambiguated record
Kouichi Miyashita
Also filed as: MIYASHITA KOUICHI
5 granted patents·4 pending applications·40 citations·filing 2002–2019
72Inventor score
Top patents by PatentIndex Score
9 records- 0182US7012678B2Inspection method and inspection apparatus for detecting defectsNGK INSULATORS LTD·Filed 2002·Granted Mar 14, 2006·37 cites·14 claims
- 0264US2017013682A1High frequency induction continuous heating method and high frequency induction continuous heating apparatusDENKI KOGYO COMPANY LTD·Filed 2016·Application pending·0 cites
- 0363US8422014B2Method for inspecting defect of article to be inspectedHATANO TATSUHIKO·Filed 2010·Granted Apr 16, 2013·2 cites·12 claims
- 0458US2014346164A1High frequency induction continuous heating method and high frequency induction continuous heating apparatusDENKI KOGYO COMPANY LTD·Filed 2012·Application pending·0 cites
- 0545US8966959B2Filter inspection method and filter inspection apparatusMIYASHITA KOUICHI·Filed 2012·Granted Mar 3, 2015·1 cites·16 claims
- 0643US11559851B2Laser machining device and laser machining methodFANUC CORP·Filed 2017·Granted Jan 24, 2023·0 cites·8 claims
- 0738US11145515B2Manufacturing method of semiconductor device with attached filmDENSO CORP·Filed 2019·Granted Oct 12, 2021·0 cites·9 claims
- 0838US2016059351A1Laser beam machining apparatus with high-speed positioning functionFANUC CORP·Filed 2015·Application pending·0 cites
- 0931US2012276746A1Manufacturing method of semiconductor device and apparatus for manufacturing semiconductor deviceHIKIDA YUJI·Filed 2011·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →