Inventor · disambiguated record
Robert F. Wiedmaier
Also filed as: WIEDMAIER ROBERT · WIEDMAIER ROBERT F
4 granted patents·4 citations·filing 2014–2017
62Inventor score
Top patents by PatentIndex Score
4 records- 0171US10794840B2Apparatus for semiconductor package inspectionINTEL CORP·Filed 2017·Granted Oct 6, 2020·2 cites·11 claims
- 0260US9488595B2Inspection of microelectronic devices using near-infrared lightZHANG LIANG W·Filed 2014·Granted Nov 8, 2016·2 cites·8 claims
- 0351US10572992B22D metrology technique for solder paste inspectionINTEL CORP·Filed 2017·Granted Feb 25, 2020·0 cites·36 claims
- 0447US10066927B2Inspection of microelectronic devices using near-infrared lightINTEL CORP·Filed 2016·Granted Sep 4, 2018·0 cites·17 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →