Inventor · disambiguated record
William Schaffer
Also filed as: SCHAFFER WILLIAM · SCHAFFER WILLIAM J
9 granted patents·1 pending application·61 citations·filing 1978–2018
86Inventor score
Top patents by PatentIndex Score
10 records- 0190US8518838B2Method of thermal processing structures formed on a substrateCAREY PAUL·Filed 2012·Granted Aug 27, 2013·10 cites·20 claims
- 0286US7569463B2Method of thermal processing structures formed on a substrateAPPLIED MATERIALS INC·Filed 2006·Granted Aug 4, 2009·9 cites·25 claims
- 0379US8377737B1Methods of short wavelength laser scribing of a thin film photovoltaic devicePRIMESTAR SOLAR INC·Filed 2011·Granted Feb 19, 2013·3 cites·19 claims
- 0476US4669076AOptical disk drive apparatus with means for accurate disk positioningIBM·Filed 1985·Granted May 26, 1987·24 cites·2 claims
- 0572US10141191B2Method of thermal processing structures formed on a substrateCAREY PAUL·Filed 2010·Granted Nov 27, 2018·2 cites·17 claims
- 0663US10840100B2Method of thermal processing structures formed on a substrateAPPLIED MATERIALS INC·Filed 2018·Granted Nov 17, 2020·0 cites·20 claims
- 0755US9555502B2Dual lasers for removing glass-side debris during the manufacture of thin film photovoltaic devicesFELDMAN-PEABODY SCOTT DANIEL·Filed 2012·Granted Jan 31, 2017·0 cites·21 claims
- 0839US6103539AMethod and system for nondestructive layer defect detectionXMR INC·Filed 1998·Granted Aug 15, 2000·9 cites·14 claims
- 0936US4176382AHigh performance tape path for a 19 inch tape recorderIBM·Filed 1978·Granted Nov 27, 1979·4 cites·4 claims
- 1035US2003040130A1Method for selection of parameters for implant anneal of patterned semiconductor substrates and specification of a laser systemFiled 2001·Application pending·0 cites
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