Inventor · disambiguated record
Hiroyuki Nakayashiki
Also filed as: NAKAYASHIKI HIROYUKI
2 granted patents·25 citations·filing 2002–2005
62Inventor score
Technology areasH10P
Files withOKI ELECTRIC IND CO LTD2
Top patents by PatentIndex Score
2 records- 0185US7081758B2Inspection pattern, inspection method, and inspection system for detection of latent defect of multi-layer wiring structureOKI ELECTRIC IND CO LTD·Filed 2005·Granted Jul 25, 2006·13 cites·20 claims
- 0267US6884637B2Inspection pattern, inspection method, and inspection system for detection of latent defect of multi-layer wiring structureOKI ELECTRIC IND CO LTD·Filed 2002·Granted Apr 26, 2005·12 cites·16 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →