Inventor · disambiguated record
Motohiro Kouno
Also filed as: KOUNO MOTOHIRO
7 granted patents·185 citations·filing 1991–1994
88Inventor score
Files withDAINIPPON SCREEN MFG7
Top patents by PatentIndex Score
7 records- 0184US5233291AMethod of and apparatus for measuring electric characteristics of semiconductor waferDAINIPPON SCREEN MFG·Filed 1991·Granted Aug 3, 1993·59 cites·27 claims
- 0269US5239183AOptical gap measuring device using frustrated internal reflectionDAINIPPON SCREEN MFG·Filed 1992·Granted Aug 24, 1993·28 cites·14 claims
- 0365US5225690AGap measuring device and method using frustrated internal reflectionDAINIPPON SCREEN MFG·Filed 1991·Granted Jul 6, 1993·25 cites·58 claims
- 0458US5568252AMethod and apparatus for measuring insulation film thickness of semiconductor waferDAINIPPON SCREEN MFG·Filed 1994·Granted Oct 22, 1996·30 cites·12 claims
- 0550US5554939ANon-destructive measuring sensor for semiconductor wafer and method of manufacturing the sameDAINIPPON SCREEN MFG·Filed 1993·Granted Sep 10, 1996·14 cites·12 claims
- 0650US5475319AMethod of measuring electric charge of semiconductor waferDAINIPPON SCREEN MFG·Filed 1994·Granted Dec 12, 1995·20 cites·10 claims
- 0742US5444389AMethod and apparatus for measuring lifetime of minority carriers in semiconductorDAINIPPON SCREEN MFG·Filed 1993·Granted Aug 22, 1995·9 cites·14 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →