Inventor · disambiguated record
Hideo Sakagawa
Also filed as: SAKAGAWA HIDEO
3 granted patents·79 citations·filing 1989–2005
71Inventor score
Files withTOKYO ELECTRON LTD3
Top patents by PatentIndex Score
3 records- 0191US6906542B2Probing method and proberTOKYO ELECTRON LTD·Filed 2003·Granted Jun 14, 2005·69 cites·13 claims
- 0277US7417445B2Probing method and prober for measuring electrical characteristics of circuit devicesTOKYO ELECTRON LTD·Filed 2005·Granted Aug 26, 2008·6 cites·16 claims
- 0330US5034684AProbe device and method of controlling the sameTOKYO ELECTRON LTD·Filed 1989·Granted Jul 23, 1991·4 cites·15 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →