Inventor · disambiguated record
Francis M. Tambwe
Also filed as: TAMBWE FRANCIS M
7 granted patents·63 citations·filing 2004–2016
83Inventor score
Top patents by PatentIndex Score
7 records- 0191US9275890B2Methods of forming alignment marks and overlay marks on integrated circuit products employing FinFET devices and the resulting alignment/overlay markGLOBALFOUNDRIES INC·Filed 2013·Granted Mar 1, 2016·10 cites·16 claims
- 0285US7166506B2Poly open polish processINTEL CORP·Filed 2004·Granted Jan 23, 2007·34 cites·20 claims
- 0382US8969932B2Methods of forming a finfet semiconductor device with undoped finsGLOBALFOUNDRIES INC·Filed 2012·Granted Mar 3, 2015·6 cites·26 claims
- 0480US9105507B2Methods of forming a FinFET semiconductor device with undoped finsGLOBALFOUNDRIES INC·Filed 2015·Granted Aug 11, 2015·3 cites·20 claims
- 0571US8975141B2Dual work function FinFET structures and methods for fabricating the sameWEI ANDY C·Filed 2012·Granted Mar 10, 2015·3 cites·20 claims
- 0657US7125321B2Multi-platen multi-slurry chemical mechanical polishing processINTEL CORP·Filed 2004·Granted Oct 24, 2006·7 cites·16 claims
- 0753US9515026B2Methods of forming alignment marks and overlay marks on integrated circuit products employing FinFET devices and the resulting alignment/overlay markGLOBALFOUNDRIES INC·Filed 2016·Granted Dec 6, 2016·0 cites·17 claims
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