Inventor · disambiguated record
Tsung-Pao Fang
Also filed as: FANG TSUNG-PAO
4 granted patents·2 pending applications·42 citations·filing 1992–2023
74Inventor score
Top patents by PatentIndex Score
6 records- 0180US8139844B2Methods and systems for determining a defect criticality index for defects on wafersCHEN CHIEN-HUEI ADAM·Filed 2008·Granted Mar 20, 2012·11 cites·19 claims
- 0264US7894659B2Methods for accurate identification of an edge of a care area for an array area formed on a wafer and methods for binning defects detected in an array area formed on a waferKLA TENCOR TECH CORP·Filed 2007·Granted Feb 22, 2011·3 cites·17 claims
- 0360US8213705B2Methods for accurate identification of an edge of a care area for an array area formed on a wafer and methods for binning defects detected in an array area formed on a waferCHEN CHIEN-HUEI ADAM·Filed 2011·Granted Jul 3, 2012·1 cites·20 claims
- 0457US2024394454A1Pattern matching methodASML NETHERLANDS BV·Filed 2022·Application pending·0 cites
- 0553US2025147433A1Field of view selection for metrology associated with semiconductor manufacturingASML NETHERLANDS BV·Filed 2023·Application pending·0 cites
- 0646US5428726ATriangulation of random and scattered dataUNIV SOUTH FLORIDA·Filed 1992·Granted Jun 27, 1995·27 cites·26 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →