Inventor · disambiguated record
Michael D. Lowell
Also filed as: LOWELL MICHAEL D · LOWELL MICHAEL DAVID
7 granted patents·422 citations·filing 1993–2002
90Inventor score
Files withIBM7
Top patents by PatentIndex Score
7 records- 0193US5420520AMethod and apparatus for testing of integrated circuit chipsIBM·Filed 1993·Granted May 30, 1995·128 cites·3 claims
- 0292US6370012B1Capacitor laminate for use in printed circuit board and as an interconnectorIBM·Filed 2000·Granted Apr 9, 2002·77 cites·6 claims
- 0389US6524352B2Method of making a parallel capacitor laminateIBM·Filed 2002·Granted Feb 25, 2003·56 cites·11 claims
- 0487US5523696AMethod and apparatus for testing integrated circuit chipsIBM·Filed 1993·Granted Jun 4, 1996·64 cites·7 claims
- 0586US5528159AMethod and apparatus for testing integrated circuit chipsIBM·Filed 1995·Granted Jun 18, 1996·63 cites·10 claims
- 0668US5672980AMethod and apparatus for testing integrated circuit chipsIBM·Filed 1996·Granted Sep 30, 1997·26 cites·2 claims
- 0741US5659256AMethod and apparatus for testing integrated circuit chipsIBM·Filed 1996·Granted Aug 19, 1997·8 cites·3 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →