Inventor · disambiguated record
Peter De Wolf
Also filed as: DE WOLF PETER
5 granted patents·2 pending applications·209 citations·filing 1994–2025
84Inventor score
Top patents by PatentIndex Score
7 records- 0182US5723981AMethod for measuring the electrical potential in a semiconductor elementIMEC VZW·Filed 1996·Granted Mar 3, 1998·73 cites·21 claims
- 0275US6201401B1Method for measuring the electrical potential in a semiconductor elementIMEC·Filed 1998·Granted Mar 13, 2001·50 cites·33 claims
- 0371US6091248AMethod for measuring the electrical potential in a semiconductor elementIMEC VZW·Filed 1998·Granted Jul 18, 2000·43 cites·31 claims
- 0471US5585734AMethod for determining the resistance and carrier profile of a semiconductor element using a scanning proximity microscopeIMEC INTER UNI MICRO ELECTR·Filed 1994·Granted Dec 17, 1996·31 cites·31 claims
- 0564US6287880B1Method and apparatus for high resolution profiling in semiconductor structuresVEECO INSTR INC·Filed 2000·Granted Sep 11, 2001·12 cites·29 claims
- 0660US2025277809A1Probe-Based Instrument and Method Using Torsional Oscillation SensingBRUKER NANO INC·Filed 2025·Application pending·0 cites
- 0755US2025244359A1Method and Apparatus of Magnetic Property Measurement Using an AFM Operating in a Force Mapping AFM ModeBRUKER NANO INC·Filed 2025·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →