Inventor · disambiguated record
Hsiao-Leng Li
Also filed as: LI HSIAO-LENG
1 granted patent·3 pending applications·6 citations·filing 2013–2015
28Inventor score
Files withMACRONIX INT CO LTD4
Top patents by PatentIndex Score
4 records- 0178US9870943B2Contact process and contact structure for semiconductor deviceMACRONIX INT CO LTD·Filed 2015·Granted Jan 16, 2018·6 cites·10 claims
- 0242US2016110859A1Inspection method for contact by die to databaseMACRONIX INT CO LTD·Filed 2014·Application pending·0 cites
- 0334US2016041201A1Die structure, contact test structure, and contact testing method utilizing the contact test structureMACRONIX INT CO LTD·Filed 2014·Application pending·0 cites
- 0432US2014253137A1Test pattern design for semiconductor devices and method of utilizing thereofMACRONIX INT CO LTD·Filed 2013·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →