Inventor · disambiguated record
Max Haider
Also filed as: HAIDER MAX
2 granted patents·26 citations·filing 2002–2003
61Inventor score
Technology areasH01J
Top patents by PatentIndex Score
2 records- 0178US6903337B2Examining system for the particle-optical imaging of an object, deflector for charged particles as well as method for the operation of the sameZEISS CARL SMT AG·Filed 2002·Granted Jun 7, 2005·15 cites·34 claims
- 0273US7135677B2Beam guiding arrangement, imaging method, electron microscopy system and electron lithography systemZEISS CARL NTS GMBH·Filed 2003·Granted Nov 14, 2006·11 cites·44 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →