Inventor · disambiguated record
Kun Liu
Also filed as: LIU KUN · LIU KUN YI
26 granted patents·4 pending applications·242 citations·filing 1999–2021
95Inventor score
Top patents by PatentIndex Score
30 records- 0198US9871132B1Extended drain metal-oxide-semiconductor transistorGLOBALFOUNDRIES SG PTE LTD·Filed 2016·Granted Jan 16, 2018·61 cites·19 claims
- 0293US12078527B2Differential COTDR distributed acoustic sensing device and method based on heterogeneous double-sideband chirped-pulsesUNIV TIANJIN·Filed 2020·Granted Sep 3, 2024·4 cites·2 claims
- 0393US9673084B2Isolation scheme for high voltage deviceGLOBALFOUNDRIES SG PTE LTD·Filed 2015·Granted Jun 6, 2017·13 cites·22 claims
- 0491US11205069B1Hybrid cornea and pupil trackingFACEBOOK TECH LLC·Filed 2020·Granted Dec 21, 2021·3 cites·13 claims
- 0590US7489982B2Method and software for conducting efficient lithography WPH / lost time analysis in semiconductor manufacturingWAFERTECH LLC·Filed 2006·Granted Feb 10, 2009·13 cites·20 claims
- 0690US6824931B2Verification photomaskTAIWAN SEMICONDUCTOR MFG·Filed 2002·Granted Nov 30, 2004·69 cites·15 claims
- 0781US6664177B1Dielectric ARC scheme to improve photo window in dual damascene processTAIWAN SEMICONDUCTOR MFG·Filed 2002·Granted Dec 16, 2003·31 cites·31 claims
- 0880US9322740B2Distributed disturbance sensing device and the related demodulation method based on polarization sensitive optical frequency domain reflectometryLIU TIEGEN·Filed 2011·Granted Apr 26, 2016·9 cites·4 claims
- 0972US6602642B2Optical proximity correction verification maskTAIWAN SEMICONDUCTOR MFG·Filed 2001·Granted Aug 5, 2003·11 cites·9 claims
- 1071US8934100B2Multi-band multiplexing intra-cavity gas sensing system and methodLIU KUN·Filed 2011·Granted Jan 13, 2015·2 cites·4 claims
- 1169US7659965B2High throughput wafer stage design for optical lithography exposure apparatusWAFERTECH LLC·Filed 2006·Granted Feb 9, 2010·2 cites·18 claims
- 1263US10365088B2Distributed measuring device and method for simultaneously measuring strain and temperature based on optical frequency domain reflectionUNIV TIANJIN·Filed 2016·Granted Jul 30, 2019·1 cites·7 claims
- 1357US11996441B2Semiconductor device for high voltage applicationsGLOBALFOUNDRIES SG PTE LTD·Filed 2021·Granted May 28, 2024·0 cites·20 claims
- 1455US9074957B2High stable fiber fabry-perot pressure sensor with glue-free packing and its fabrication methodJIANG JUNFENG·Filed 2012·Granted Jul 7, 2015·2 cites·6 claims
- 1553US6602641B1Wafer's zero-layer and alignment mark print without mask when using scannerTAIWAN SEMICONDUCTOR MFG·Filed 2001·Granted Aug 5, 2003·3 cites·8 claims
- 1653US6030732AIn-situ etch process control monitorTAIWAN SEMICONDUCTOR MFG·Filed 1999·Granted Feb 29, 2000·18 cites·18 claims
- 1745US2020309840A1Error Detection Wiring Circuit and Switching Device for Instrument Transformers in Distribution Power GridHE DAKE·Filed 2019·Application pending·0 cites
- 1843US10057522B2Image sensor and method and apparatus for removing sunspot of the sameBYD CO LTD·Filed 2015·Granted Aug 21, 2018·0 cites·13 claims
- 1941US2020309829A1On-line monitoring system for the performance of the measurement equipment in the entire power grid based on wide-area synchronous measurementHE DAKE·Filed 2019·Application pending·0 cites
- 2040US11289896B2System and method for autonomous monitoring and active defense of lightningUNIV CHENGDU INFORMATION TECHNOLOGY·Filed 2020·Granted Mar 29, 2022·0 cites·15 claims
- 2140US8958075B2Swing-style and high signal-to-noise ratio demodulation devices and corresponding demodulation method for the measurement of low coherence interference displacementLIU TIEGEN·Filed 2012·Granted Feb 17, 2015·0 cites·9 claims
- 2238US11654568B23D measurement model and spatial calibration method based on 1D displacement sensorUNIV DALIAN TECH·Filed 2019·Granted May 23, 2023·0 cites·1 claims
- 2337US11473992B2Residual pressure measurement system for Fabry-Perot cavity of optical MEMS pressure sensor and method thereofUNIV TIANJIN·Filed 2018·Granted Oct 18, 2022·0 cites·2 claims
- 2435US10508938B2Fiber optical fabry-perot flow test device and test method with local bending diversion structureUNIV TIANJIN·Filed 2016·Granted Dec 17, 2019·0 cites·7 claims
- 2535US9847361B2Pixel cell, image sensor, and manufacturing methodBYD CO LTD·Filed 2013·Granted Dec 19, 2017·0 cites·12 claims
- 2635US8951833B2Defect free deep trench method for semiconductor chipLIU KUN-YI·Filed 2011·Granted Feb 10, 2015·0 cites·19 claims
- 2733US10365126B2Distributed optical fiber disturbance positioning system based on the asymmetric dual Mach-Zehnder interference, and positioning method thereofUNIV TIANJIN·Filed 2016·Granted Jul 30, 2019·0 cites·5 claims
- 2833US2019121048A1Optical fiber laying method by using archimedes spiral in optical frequency domain reflectionUNIV TIANJIN·Filed 2016·Application pending·0 cites
- 2933US2018283969A1High resolution polarized low-coherence interference pressure measurement device and method thereofUNIV TIANJIN·Filed 2016·Application pending·0 cites
- 3029US11181400B2Fiber Bragg Grating demodulation device capable of supressing fluctuations at variable ambient temperature and demodulation method thereofUNIV TIANJIN·Filed 2016·Granted Nov 23, 2021·0 cites·1 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →