Inventor · disambiguated record

Damon Heer

Also filed as: HEER DAMON

1 granted patent·9 citations·filing 2012–2012

31Inventor score

Technology areasH01J

Files withFEI CO1

Top patents by PatentIndex Score

1 record

0185US8884247B2System and method for ex situ analysis of a substrateFEI CO·Filed 2012·Granted Nov 11, 2014·9 cites·7 claims

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