Inventor · disambiguated record
Byong-Kwon Lee
Also filed as: LEE BYONG-KWON
5 granted patents·1 pending application·43 citations·filing 2002–2008
78Inventor score
Files withSAMSUNG ELECTRONICS CO LTD6
Top patents by PatentIndex Score
6 records- 0182US6822330B2Semiconductor integrated circuit device with test element group circuitSAMSUNG ELECTRONICS CO LTD·Filed 2003·Granted Nov 23, 2004·24 cites·15 claims
- 0262US7971117B2Test circuits of semiconductor memory device for multi-chip testing and method for testing multi chipsSAMSUNG ELECTRONICS CO LTD·Filed 2008·Granted Jun 28, 2011·5 cites·20 claims
- 0362US7068058B2Semiconductor integrated circuit device with test element group circuitSAMSUNG ELECTRONICS CO LTD·Filed 2004·Granted Jun 27, 2006·7 cites·2 claims
- 0451US6714038B2Apparatus for controlling input termination of semiconductor memory device and method for the sameSAMSUNG ELECTRONICS CO LTD·Filed 2002·Granted Mar 30, 2004·7 cites·21 claims
- 0544US2009008799A1Dual mirror chips, wafer including the dual mirror chips, multi-chip packages, methods of fabricating the dual mirror chip, the wafer, and multichip packages, and a method for testing the dual mirror chipsSAMSUNG ELECTRONICS CO LTD·Filed 2008·Application pending·0 cites
- 0639US7340560B2Methods and devices for accessing a memory using multiple separate address mapped temporary storage areasSAMSUNG ELECTRONICS CO LTD·Filed 2004·Granted Mar 4, 2008·0 cites·23 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →