Inventor · disambiguated record
Wen Jin
Also filed as: JIN WEN · JIN WEN X · JIN WEN XU
24 granted patents·12 pending applications·215 citations·filing 2002–2023
95Inventor score
Top patents by PatentIndex Score
36 records- 0195US7372583B1Controlling a fabrication tool using support vector machineTOKYO ELECTRON LTD·Filed 2007·Granted May 13, 2008·22 cites·23 claims
- 0290US7567352B2Controlling a fabrication tool using support vector machineTOKYO ELECTRON LTD·Filed 2008·Granted Jul 28, 2009·10 cites·23 claims
- 0388US8038912B2Method and apparatus for the dry release of a compliant ophthalmic article from mold surfaceBAUSCH & LOMB·Filed 2009·Granted Oct 18, 2011·10 cites·5 claims
- 0486US7428060B2Optimization of diffraction order selection for two-dimensional structuresTIMBRE TECH INC·Filed 2006·Granted Sep 23, 2008·17 cites·41 claims
- 0584US11593650B2Determining confident data samples for machine learning models on unseen dataGE PREC HEALTHCARE LLC·Filed 2020·Granted Feb 28, 2023·2 cites·20 claims
- 0684US8221659B2Method and apparatus for the dry release of a compliant ophthalmic article from a mold surfaceBEEBE KEVIN·Filed 2011·Granted Jul 17, 2012·7 cites·12 claims
- 0780US9059038B2System for in-situ film stack measurement during etching and etch control methodTOKYO ELECTRON LTD·Filed 2013·Granted Jun 16, 2015·5 cites·10 claims
- 0876US9490183B2Nondestructive inline X-ray metrology with model-based library methodTOKYO ELECTRON LTD·Filed 2015·Granted Nov 8, 2016·2 cites·14 claims
- 0976US8577820B2Accurate and fast neural network training for library-based critical dimension (CD) metrologyJIN WEN·Filed 2011·Granted Nov 5, 2013·8 cites·18 claims
- 1076US8452718B2Determination of training set size for a machine learning systemJIN WEN·Filed 2010·Granted May 28, 2013·9 cites·25 claims
- 1176US7311194B2Lens mounting fixture for accommodating IOLBAUSCH & LOMB·Filed 2003·Granted Dec 25, 2007·74 cites·16 claims
- 1275US8381140B2Wide process range library for metrologyTOKYO ELECTRON LTD·Filed 2011·Granted Feb 19, 2013·3 cites·26 claims
- 1375US6842261B2Integrated circuit profile value determinationTIMBRE TECH INC·Filed 2002·Granted Jan 11, 2005·14 cites·45 claims
- 1471US11514329B2Data-driven deep learning model generalization analysis and improvementGEN ELECTRIC·Filed 2019·Granted Nov 29, 2022·2 cites·20 claims
- 1571US9607265B2Accurate and fast neural network training for library-based critical dimension (CD) metrologyJIN WEN·Filed 2013·Granted Mar 28, 2017·5 cites·8 claims
- 1667US2025158344A1Laser beam dump assembly and method of manufactureNEWPORT CORP·Filed 2023·Application pending·0 cites
- 1766US10374566B2Perceptual power reduction system and methodMAXIM INTEGRATED PRODUCTS·Filed 2017·Granted Aug 6, 2019·1 cites·15 claims
- 1862US7281699B2Universal accommodating IOL holder for lens processing and packagingBAUSCH & LOMB·Filed 2003·Granted Oct 16, 2007·19 cites·10 claims
- 1961US7483809B2Optical metrology using support vector machine with profile parameter inputsTOKYO ELECTRON LTD·Filed 2007·Granted Jan 27, 2009·1 cites·21 claims
- 2059US10684440B2System and method for mounting and aligning different size optical components using linked-rail mountingNEWPORT CORP·Filed 2018·Granted Jun 16, 2020·0 cites·20 claims
- 2159US10684439B2System and method for mounting and aligning optical components with respect to junction optical componentNEWPORT CORP·Filed 2018·Granted Jun 16, 2020·0 cites·20 claims
- 2259US9964728B2System and method for mounting and aligning optical components using single-rail mountingNEWPORT CORP·Filed 2014·Granted May 8, 2018·0 cites·9 claims
- 2357US7630873B2Approximating eigensolutions for use in determining the profile of a structure formed on a semiconductor waferTOKYO ELECTRON LTD·Filed 2003·Granted Dec 8, 2009·4 cites·39 claims
- 2452US2024242948A1Precise Tuning of MCP-Based Ion Detector Using Isotope Ratios with Software CorrectionDH TECHNOLOGIES DEV PTE LTD·Filed 2022·Application pending·0 cites
- 2551US2008051801A1Universal Accommodating IOL Holder for Lens Processing and PackagingHOVEY LARRY C·Filed 2007·Application pending·0 cites
- 2650US2024249929A1Gain Calibration for Quantitation Using On-Demand/Dynamic Implementation of MS Sensitivity Improvement TechniquesDH TECHNOLOGIES DEV PTE LTD·Filed 2022·Application pending·0 cites
- 2746US10302893B2Optical component mount device and post system and method of useNEWPORT CORP·Filed 2017·Granted May 28, 2019·0 cites·12 claims
- 2845US7511835B2Optical metrology using a support vector machine with simulated diffraction signal inputsTOKYO ELECTRON LTD·Filed 2007·Granted Mar 31, 2009·0 cites·16 claims
- 2945US2021124146A1Low wavefront distortion optical mount for thin optical componentsNEWPORT CORP·Filed 2020·Application pending·0 cites
- 3044US2007132118A1Method and Apparatus for Treatment of a Device-in-Mold Assembly with a Supercritical FluidBAUSCH & LOMB·Filed 2005·Application pending·0 cites
- 3143US2006037871A1Holder for dual optic IOLJIN WEN X·Filed 2004·Application pending·0 cites
- 3237US2018286643A1Advanced optical sensor, system, and methodologies for etch processing monitoringTOKYO ELECTRON LTD·Filed 2017·Application pending·0 cites
- 3337US2018217349A1Diffraction grating gimbal mountNEWPORT CORP·Filed 2018·Application pending·0 cites
- 3436US2017082820A1Optical component mount system for use with an optical rail systemNEWPORT CORP·Filed 2016·Application pending·0 cites
- 3532US2007138670A1Method and Apparatus for the Dry Release of a Compliant Opthalmic Article from a Mold SurfaceBAUSCH & LOMB·Filed 2005·Application pending·0 cites
- 3631US2017097489A1Low interference optical mountNEWPORT CORP·Filed 2015·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →