Inventor · disambiguated record
Yoshihiro Takahoko
Also filed as: TAKAHOKO YOSHIHIRO
8 granted patents·27 citations·filing 2012–2023
79Inventor score
Technology areasH01J
Top patents by PatentIndex Score
8 records- 0179US12027342B2Charged particle beam device and axis adjustment method thereofHITACHI HIGH TECH CORP·Filed 2023·Granted Jul 2, 2024·0 cites·4 claims
- 0269USD684274SSample holder for an electron microscopeHOSOYA KOTARO·Filed 2012·Granted Jun 11, 2013·19 cites·1 claims
- 0359US11764028B2Charged particle beam device and axis adjustment method thereofHITACHI HIGH TECH CORP·Filed 2018·Granted Sep 19, 2023·0 cites·8 claims
- 0457US10312053B2Charged particle beam apparatus, alignment method of charged particle beam apparatus, alignment program, and storage mediumHITACHI HIGH TECH CORP·Filed 2015·Granted Jun 4, 2019·1 cites·14 claims
- 0550US9349567B2Charged particle beam deviceHITACHI HIGH TECH CORP·Filed 2014·Granted May 24, 2016·0 cites·5 claims
- 0649US11342155B2Charged particle beam device and method for adjusting position of detector of charged particle beam deviceHITACHI HIGH TECH CORP·Filed 2018·Granted May 24, 2022·0 cites·14 claims
- 0746USD679411SSample holder for an electron microscopeHOSOYA KOTARO·Filed 2012·Granted Apr 2, 2013·7 cites·1 claims
- 0843US10176968B2Method for adjusting charged particle beam device and adjusting beam aperture based on a selected emission condition and charged particle beam device for sameHITACHI HIGH TECH CORP·Filed 2014·Granted Jan 8, 2019·0 cites·13 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →