Inventor · disambiguated record
Ralph Gerald Isaacs
Also filed as: ISAACS RALPH G · ISAACS RALPH GERALD
10 granted patents·1 pending application·756 citations·filing 1986–2009
92Inventor score
Top patents by PatentIndex Score
11 records- 0195US4803639AX-ray inspection systemGEN ELECTRIC·Filed 1986·Granted Feb 7, 1989·289 cites·18 claims
- 0294US5119408ARotate/rotate method and apparatus for computed tomography x-ray inspection of large objectsGEN ELECTRIC·Filed 1990·Granted Jun 2, 1992·158 cites·17 claims
- 0390US6041132AComputed tomography inspection of composite ply structureGEN ELECTRIC·Filed 1997·Granted Mar 21, 2000·146 cites·20 claims
- 0486US6711235B2X-ray inspection apparatus and methodGEN ELECTRIC CORMPANY·Filed 2002·Granted Mar 23, 2004·40 cites·11 claims
- 0586US6167110AHigh voltage x-ray and conventional radiography imaging apparatus and methodGEN ELECTRIC·Filed 1997·Granted Dec 26, 2000·80 cites·21 claims
- 0679US6985238B2Non-contact measurement system for large airfoilsGEN ELECTRIC·Filed 2002·Granted Jan 10, 2006·26 cites·21 claims
- 0777US7499830B2Computer-implemented techniques and system for characterizing geometric parameters of an edge break in a machined partGEN ELECTRIC·Filed 2005·Granted Mar 3, 2009·9 cites·19 claims
- 0866US7925075B2Inspection system and methods with autocompensation for edge break gauging orientationGEN ELECTRIC·Filed 2007·Granted Apr 12, 2011·5 cites·15 claims
- 0965US7888932B2Surface flaw detection system to facilitate nondestructive inspection of a component and methods of assembling the sameGEN ELECTRIC·Filed 2007·Granted Feb 15, 2011·3 cites·11 claims
- 1046US8045181B2Inspection system and method with multi-image phase shift analysisGEN ELECTRIC·Filed 2009·Granted Oct 25, 2011·0 cites·20 claims
- 1146US2008159477A1System and method for radiographic inspection without a-priori information of inspected objectGEN ELECTRIC·Filed 2006·Application pending·0 cites
Join the waitlist — get patent alerts
Get an alert when Ralph Gerald Isaacs files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →