Inventor · disambiguated record
Mark B. Ketchen
Also filed as: KETCHEN MARK B · KETCHEN MARK BENJAMIN
50 granted patents·2 pending applications·865 citations·filing 1982–2021
98Inventor score
Top patents by PatentIndex Score
52 records- 0199US9564573B1Trilayer josephson junction structure with small air bridge and no interlevel dielectric for superconducting qubitsIBM·Filed 2015·Granted Feb 7, 2017·40 cites·10 claims
- 0297US10381542B2Trilayer Josephson junction structure with small air bridge and no interlevel dielectric for superconducting qubitsIBM·Filed 2015·Granted Aug 13, 2019·16 cites·17 claims
- 0397US7733109B2Test structure for resistive open detection using voltage contrast inspection and related methodsIBM·Filed 2007·Granted Jun 8, 2010·92 cites·29 claims
- 0496US9614532B1Single-flux-quantum probabilistic digitizerIBM·Filed 2015·Granted Apr 4, 2017·18 cites·25 claims
- 0595US10199554B2Trilayer Josephson junction structure with small air bridge and no interlevel dielectric for superconducting qubitsIBM·Filed 2016·Granted Feb 5, 2019·8 cites·20 claims
- 0695US8642998B2Array of quantum systems in a cavity for quantum computingGAMBETTA JAY M·Filed 2011·Granted Feb 4, 2014·48 cites·25 claims
- 0795US7190233B2Methods and apparatus for measuring change in performance of ring oscillator circuitIBM·Filed 2005·Granted Mar 13, 2007·35 cites·28 claims
- 0893US8547732B2Hybrid superconducting-magnetic memory cell and arrayBULZACCHELLI JOHN F·Filed 2012·Granted Oct 1, 2013·14 cites·18 claims
- 0991US9379303B2Modular array of fixed-coupling quantum systems for quantum information processingGAMBETTA JAY M·Filed 2011·Granted Jun 28, 2016·27 cites·14 claims
- 1090US8208288B2Hybrid superconducting-magnetic memory cell and arrayBULZACCHELLI JOHN F·Filed 2008·Granted Jun 26, 2012·17 cites·15 claims
- 1189US11757467B2Circuits for converting SFQ-based RZ and NRZ signaling to bilevel voltage NRZ signalingKNEE DEREK L·Filed 2021·Granted Sep 12, 2023·4 cites·20 claims
- 1289US6605981B2Apparatus for biasing ultra-low voltage logic circuitsIBM·Filed 2001·Granted Aug 12, 2003·51 cites·14 claims
- 1388US5055158APlanarization of Josephson integrated circuitIBM·Filed 1991·Granted Oct 8, 1991·78 cites·14 claims
- 1486US7504875B2Methods and apparatus for characterizing electronic fuses used to personalize an integrated circuitIBM·Filed 2007·Granted Mar 17, 2009·10 cites·20 claims
- 1586US7295057B2Methods and apparatus for characterizing electronic fuses used to personalize an integrated circuitIBM·Filed 2005·Granted Nov 13, 2007·11 cites·18 claims
- 1686US7265639B2Methods and apparatus for ring oscillator based MOSFET gate capacitance measurementsIBM·Filed 2005·Granted Sep 4, 2007·14 cites·21 claims
- 1785US9793913B2Single-flux-quantum probabilistic digitizerIBM·Filed 2017·Granted Oct 17, 2017·5 cites·18 claims
- 1885US6798261B1Method and apparatus for characterizing switching history impactIBM·Filed 2003·Granted Sep 28, 2004·31 cites·27 claims
- 1984US6960926B2Method and apparatus for characterizing a circuit with multiple inputsIBM·Filed 2002·Granted Nov 1, 2005·29 cites·26 claims
- 2083US4588947AIntegrated miniature DC SQUID susceptometer for measuring properties of very small samplesIBM·Filed 1983·Granted May 13, 1986·42 cites·21 claims
- 2179US7069525B2Method and apparatus for determining characteristics of MOS devicesIBM·Filed 2003·Granted Jun 27, 2006·22 cites·31 claims
- 2279US4851767ADetachable high-speed opto-electronic sampling probeIBM·Filed 1988·Granted Jul 25, 1989·37 cites·7 claims
- 2377US6545333B1Light controlled silicon on insulator deviceIBM·Filed 2001·Granted Apr 8, 2003·23 cites·22 claims
- 2476US8188752B2Yield improvement for Josephson junction test device formationKETCHEN MARK B·Filed 2009·Granted May 29, 2012·9 cites·20 claims
- 2576US5056111AIntegrated terahertz electromagnetic wave systemIBM·Filed 1988·Granted Oct 8, 1991·44 cites·20 claims
- 2675US8456169B2High speed measurement of random variation/yield in integrated circuit device testingBHUSHAN MANJUL·Filed 2010·Granted Jun 4, 2013·3 cites·20 claims
- 2775US7355902B2Methods and apparatus for inline characterization of high speed operating margins of a storage elementIBM·Filed 2006·Granted Apr 8, 2008·9 cites·20 claims
- 2875US7176695B2Method and apparatus for measuring transfer characteristics of a semiconductor deviceIBM·Filed 2006·Granted Feb 13, 2007·6 cites·20 claims
- 2973US7504896B2Methods and apparatus for inline measurement of switching delay history effects in PD-SOI technologyIBM·Filed 2006·Granted Mar 17, 2009·7 cites·13 claims
- 3071US7085658B2Method and apparatus for rapid inline measurement of parameter spreads and defects in integrated circuit chipsIBM·Filed 2004·Granted Aug 1, 2006·14 cites·74 claims
- 3169US8691608B2Semiconductor devices having nanochannels confined by nanometer-spaced electrodesIBM·Filed 2013·Granted Apr 8, 2014·2 cites·20 claims
- 3268US8558326B2Semiconductor devices having nanochannels confined by nanometer-spaced electrodesHARRER STEFAN·Filed 2012·Granted Oct 15, 2013·2 cites·19 claims
- 3367US8755220B2Hybrid superconducting-magnetic memory cell and arrayIBM·Filed 2013·Granted Jun 17, 2014·2 cites·20 claims
- 3464US11133452B2Trilayer Josephson junction structure with small air bridge and no interlevel dielectric for superconducting qubitsIBM·Filed 2019·Granted Sep 28, 2021·0 cites·20 claims
- 3564US8248094B2Acquisition of silicon-on-insulator switching history effects statisticsBHUSHAN MANJUL·Filed 2009·Granted Aug 21, 2012·4 cites·20 claims
- 3663US8179120B2Single level of metal test structure for differential timing and variability measurements of integrated circuitsBHUSHAN MANJUL·Filed 2009·Granted May 15, 2012·3 cites·16 claims
- 3762US7512509B2M1 testable addressable array for device parameter characterizationIBM·Filed 2007·Granted Mar 31, 2009·3 cites·20 claims
- 3862US5635836AMechanical apparatus with rod, pivot, and translation means for positioning a sample for use with a scanning microscopeIBM·Filed 1994·Granted Jun 3, 1997·26 cites·18 claims
- 3960US5786690AHigh resolution three-axis scanning squid microscope having planar solenoidsIBM·Filed 1994·Granted Jul 28, 1998·21 cites·6 claims
- 4058US5523686AProbes for scanning SQUID magnetometersIBM·Filed 1994·Granted Jun 4, 1996·19 cites·11 claims
- 4157US7342406B2Methods and apparatus for inline variability measurement of integrated circuit componentsIBM·Filed 2005·Granted Mar 11, 2008·2 cites·15 claims
- 4257US4528530ALow temperature electronic package having a superconductive interposer for interconnecting strip type circuitsIBM·Filed 1982·Granted Jul 9, 1985·15 cites·9 claims
- 4355US8310269B2Measurement of partially depleted silicon-on-insulator CMOS circuit leakage current under different steady state switching conditionsBHUSHAN MANJUL·Filed 2009·Granted Nov 13, 2012·2 cites·22 claims
- 4450US9194909B2Single level of metal test structure for differential timing and variability measurements of integrated circuitsBHUSHAN MANJUL·Filed 2012·Granted Nov 24, 2015·0 cites·11 claims
- 4550US9075109B2Single level of metal test structure for differential timing and variability measurements of integrated circuitsBHUSHAN MANJUL·Filed 2012·Granted Jul 7, 2015·0 cites·11 claims
- 4647US7583125B2Methods and apparatus for pulse generation used in characterizing electronic fusesIBM·Filed 2007·Granted Sep 1, 2009·0 cites·14 claims
- 4747US2012326720A1Modular array of fixed-coupling quantum systems for quantum information processingGAMBETTA JAY M·Filed 2012·Application pending·0 cites
- 4846US7595654B2Methods and apparatus for inline variability measurement of integrated circuit componentsIBM·Filed 2008·Granted Sep 29, 2009·0 cites·8 claims
- 4942US8027797B2Methods and apparatus for determining a switching history time constant in an integrated circuit deviceIBM·Filed 2008·Granted Sep 27, 2011·0 cites·20 claims
- 5040US7145347B2Method and apparatus for measuring transfer characteristics of a semiconductor deviceIBM·Filed 2004·Granted Dec 5, 2006·0 cites·20 claims
Showing the top 50 of 52 patent records by PatentIndex Score.
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →