Inventor · disambiguated record
Ekkehard Pruefer
Also filed as: PRUEFER EKKEHARD
3 granted patents·1 pending application·9 citations·filing 2005–2007
59Inventor score
Top patents by PatentIndex Score
4 records- 0173US7358150B2Trench isolation structure for a semiconductor device with reduced sidewall stress and a method of manufacturing the sameADVANCED MICRO DEVICES INC·Filed 2006·Granted Apr 15, 2008·7 cites·18 claims
- 0264US7528026B2Method for reducing silicide defects by removing contaminants prior to drain/source activationADVANCED MICRO DEVICES INC·Filed 2006·Granted May 5, 2009·2 cites·16 claims
- 0338US8697530B2Drain/source extension structure of a field effect transistor with reduced boron diffusionPRUEFER EKKEHARD·Filed 2007·Granted Apr 15, 2014·0 cites·20 claims
- 0431US2006094193A1Semiconductor device including semiconductor regions having differently strained channel regions and a method of manufacturing the sameHORSTMANN MANFRED·Filed 2005·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →