Inventor · disambiguated record
Yue-Shiun Lee
Also filed as: LEE YUE-SHIUN
7 granted patents·30 citations·filing 2001–2011
80Inventor score
Top patents by PatentIndex Score
7 records- 0166US6514778B2Method for measuring effective gate channel length during C-V methodUNITED MICROELECTRONICS CORP·Filed 2001·Granted Feb 4, 2003·15 cites·3 claims
- 0257US7808248B2Radio frequency test key structureUNITED MICROELECTRONICS CORP·Filed 2006·Granted Oct 5, 2010·2 cites·24 claims
- 0357US7317239B2Method for manufacturing a resistorUNITED MICROELECTRONICS CORP·Filed 2006·Granted Jan 8, 2008·1 cites·4 claims
- 0456US8093916B2Method of characterizing a semiconductor device and semiconductor deviceLEE YUE-SHIUN·Filed 2009·Granted Jan 10, 2012·2 cites·20 claims
- 0555US7105912B2Resistor structure and method for manufacturing the sameUNITED MICROELECTRONICS CORP·Filed 2004·Granted Sep 12, 2006·6 cites·12 claims
- 0653US7061344B2Equivalent circuits and simulation method for an RF switchUNITED MICROELECTRONICS CORP·Filed 2004·Granted Jun 13, 2006·4 cites·5 claims
- 0730US8502348B2Differential varactor deviceLEE YUE-SHIUN·Filed 2011·Granted Aug 6, 2013·0 cites·9 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →