Inventor · disambiguated record
Takehiko Ueda
Also filed as: UEDA TAKEHIKO
26 granted patents·8 pending applications·781 citations·filing 1976–2024
96Inventor score
Top patents by PatentIndex Score
34 records- 0197US6670200B2Layer-thickness detection methods and apparatus for wafers and the like, and polishing apparatus comprising sameNIKON CORP·Filed 2001·Granted Dec 30, 2003·129 cites·9 claims
- 0297US6271047B1Layer-thickness detection methods and apparatus for wafers and the like, and polishing apparatus comprising sameNIKON CORP·Filed 1999·Granted Aug 7, 2001·239 cites·15 claims
- 0393US7052920B2Layer-thickness detection methods and apparatus for wafers and the like, and polishing apparatus comprising sameNIKON CORP·Filed 2001·Granted May 30, 2006·62 cites·15 claims
- 0492US6489624B1Apparatus and methods for detecting thickness of a patterned layerNIKON CORP·Filed 1998·Granted Dec 3, 2002·115 cites·32 claims
- 0591US4476219ASilver halide color photographic materialFUJI PHOTO FILM CO LTD·Filed 1983·Granted Oct 9, 1984·29 cites·4 claims
- 0685US6492665B1Semiconductor deviceMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2000·Granted Dec 10, 2002·45 cites·16 claims
- 0783US7169016B2Chemical mechanical polishing end point detection apparatus and methodNIKON CORP·Filed 2006·Granted Jan 30, 2007·11 cites·2 claims
- 0882US12138434B2Puncture needle and catheter assemblyTERUMO CORP·Filed 2020·Granted Nov 12, 2024·1 cites·16 claims
- 0979US4141730AMultilayer color photographic materialsFUJI PHOTO FILM CO LTD·Filed 1976·Granted Feb 27, 1979·15 cites·20 claims
- 1078US6963407B2Process end point detection apparatus and method, polishing apparatus, semiconductor device manufacturing method, and recording medium recorded with signal processing programNIKON CORP·Filed 2001·Granted Nov 8, 2005·19 cites·24 claims
- 1175US2024416049A1Puncture needle and catheter assemblyTERUMO CORP·Filed 2024·Application pending·0 cites
- 1273US6180472B1Method for fabricating semiconductor deviceMATSUSHITA ELECTRONS CORP·Filed 1999·Granted Jan 30, 2001·47 cites·10 claims
- 1370US11033691B2Medical puncture needleTERUMO CORP·Filed 2018·Granted Jun 15, 2021·1 cites·16 claims
- 1468US10682473B2Medical puncture needle and method for manufacturing puncture needleTERUMO CORP·Filed 2017·Granted Jun 16, 2020·1 cites·5 claims
- 1566US2025018166A1Liquid medicine administration deviceTERUMO CORP·Filed 2024·Application pending·0 cites
- 1665US12158736B2Electronic apparatus activation control apparatus, electronic apparatus activation control system, electronic apparatus activation control method, and programSATURN LICENSING LLC·Filed 2019·Granted Dec 3, 2024·0 cites·16 claims
- 1763US7981309B2Method for detecting polishing end in CMP polishing device, CMP polishing device, and semiconductor device manufacturing methodNIKON CORP·Filed 2006·Granted Jul 19, 2011·2 cites·12 claims
- 1863US5486993AControlling apparatus for high frequency high voltage power source for corona discharge processingKASUGA DENKI INC·Filed 1993·Granted Jan 23, 1996·36 cites·4 claims
- 1963US2024001027A1Drug administration deviceTERUMO CORP·Filed 2023·Application pending·0 cites
- 2063US2024001026A1Liquid medicine administration deviceTERUMO CORP·Filed 2023·Application pending·0 cites
- 2160US2024273716A1Analysis system, observation container, analysis method, and programNIKON CORP·Filed 2024·Application pending·0 cites
- 2259US10722264B2Medical puncture needle and method for manufacturing puncture needleTERUMO CORP·Filed 2018·Granted Jul 28, 2020·0 cites·7 claims
- 2358US7686673B2Working shape prediction method, working requirement determination method, working method, working system, method of manufacturing semiconductor device, computer program, and computer program storage mediumNIKON CORP·Filed 2002·Granted Mar 30, 2010·5 cites·29 claims
- 2453US11517667B2Puncture needleTERUMO CORP·Filed 2021·Granted Dec 6, 2022·0 cites·23 claims
- 2553US2014058536A1Electronic apparatus activation control apparatus, electronic apparatus activation control system, electronic apparatus activation control method, and programSONY CORP·Filed 2013·Application pending·0 cites
- 2648US10429402B2Washing/drying apparatus, screening apparatus, washing/drying method, and screening methodNIKON CORP·Filed 2014·Granted Oct 1, 2019·0 cites·19 claims
- 2748US4789624ASilver halide color photographic light-sensitive materialFUJI PHOTO FILM CO LTD·Filed 1987·Granted Dec 6, 1988·5 cites·32 claims
- 2847US10772660B2Medical puncture needle and method for manufacturing puncture needleTERUMO CORP·Filed 2018·Granted Sep 15, 2020·0 cites·12 claims
- 2943US2014027653A1Optical element, optical device, measurement device, and screening apparatusNIKON CORP·Filed 2013·Application pending·0 cites
- 3043US2016059201A1Biochip fixing method, biochip fixing device, and screening method for biomolecule arrayNIKON CORP·Filed 2014·Application pending·0 cites
- 3141US6556179B2Display device and camera having the display deviceNIKON CORP·Filed 1998·Granted Apr 29, 2003·10 cites·19 claims
- 3239US9031687B2Method for predicting worked shape, method for determining working conditions, working method, working system, semiconductor device manufacturing method, computer program and computer program storage mediumSENGA TATSUYA·Filed 2010·Granted May 12, 2015·0 cites·6 claims
- 3339US5933181APhotographic recording apparatusFUTABA DENSHI KOGYO KK·Filed 1996·Granted Aug 3, 1999·8 cites·4 claims
- 3430US6051444AMethod of manufacture of liquid crystal display device having characteristics which differ locallyNIKON CORP·Filed 1998·Granted Apr 18, 2000·1 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →