Inventor · disambiguated record
William David Reents, Jr.
Also filed as: REENTS JR WILLIAM D · REENTS JR WILLIAM DAVID · REENTS WILLIAM D · REENTS WILLIAM DAVID
9 granted patents·1 pending application·88 citations·filing 1993–2011
87Inventor score
Top patents by PatentIndex Score
10 records- 0177US5382794ALaser induced mass spectrometryAT & T CORP·Filed 1993·Granted Jan 17, 1995·40 cites·18 claims
- 0271US9183102B2Hardware consumption architectureBAUER ERIC J·Filed 2011·Granted Nov 10, 2015·3 cites·37 claims
- 0361US6748767B2Drawing an optical fiber from a sol-gel preform treated with a non-oxygenated sulfur halideLUCENT TECHNOLOGIES INC·Filed 2001·Granted Jun 15, 2004·2 cites·39 claims
- 0457US5631462ALaser-assisted particle analysisLUCENT TECHNOLOGIES INC·Filed 1995·Granted May 20, 1997·14 cites·14 claims
- 0555US6784423B2Characterization of individual particle atomic composition by aerosol mass spectrometryLUCENT TECHNOLOGIES INC·Filed 2002·Granted Aug 31, 2004·3 cites·5 claims
- 0651US5977540ALaser-assisted particle analysisLUCENT TECHNOLOGIES INC·Filed 1998·Granted Nov 2, 1999·10 cites·16 claims
- 0750US6334338B1Sol gel process of making a fiber preform with removal of oxide particlesLUCENT TECHNOLOGIES INC·Filed 1998·Granted Jan 1, 2002·9 cites·1 claims
- 0838US6073476ACalibration sample for particle analyzers and method for making the sameLUCENT TECHNOLOGIES INC·Filed 1998·Granted Jun 13, 2000·7 cites·10 claims
- 0937US2003081905A1Optical connector assemblyFiled 2001·Application pending·0 cites
- 1028US6297058B1Process for determining impurities in refractory materialsAGERE SYST OPTOELECTRONICS·Filed 1999·Granted Oct 2, 2001·0 cites·8 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →