Inventor · disambiguated record
Oliver Broermann
Also filed as: BROERMANN OLIVER
3 granted patents·6 citations·filing 2002–2004
57Inventor score
Files withINFINEON TECHNOLOGIES AG3
Top patents by PatentIndex Score
3 records- 0145US6897422B2Measuring configuration and method for measuring a critical dimension of at least one feature on a semiconductor waferINFINEON TECHNOLOGIES AG·Filed 2002·Granted May 24, 2005·4 cites·14 claims
- 0243US6980304B2Method for measuring a characteristic dimension of at least one pattern on a disc-shaped object in a measuring instrumentINFINEON TECHNOLOGIES AG·Filed 2004·Granted Dec 27, 2005·2 cites·14 claims
- 0336US7405024B2Lithographic mask, and method for covering a mask layerINFINEON TECHNOLOGIES AG·Filed 2004·Granted Jul 29, 2008·0 cites·18 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →