Inventor · disambiguated record
William Y. Chang
Also filed as: CHANG WILLIAM Y
2 granted patents·1 pending application·3 citations·filing 2006–2009
40Inventor score
Files withIBM3
Top patents by PatentIndex Score
3 records- 0163US7590507B2Structure and method for monitoring variation within an active region of a semiconductor device using scalingIBM·Filed 2007·Granted Sep 15, 2009·3 cites·20 claims
- 0249US2009112352A1Equivalent gate count yield estimation for integrated circuit devicesIBM·Filed 2009·Application pending·0 cites
- 0344US7477961B2Equivalent gate count yield estimation for integrated circuit devicesIBM·Filed 2006·Granted Jan 13, 2009·0 cites·4 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →